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Title: Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces

Abstract

We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Intense Pulsed Neutron Source (IPNS), Argonne National Laboratory (ANL), Argonne, IL (US); Northern Illlinois Univ.; Univ. of California
Sponsoring Org.:
USDOE
OSTI Identifier:
876432
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Journal Article
Journal Name:
European Physical Journal. E, Soft Matter
Additional Journal Information:
Journal Volume: 17; Journal Issue: 3; Related Information: 2005; Journal ID: ISSN 1292-8941
Publisher:
EDP Sciences
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; POLYMERS; INTERFACES; X-RAY DIFFRACTION; SURFACE TENSION; intense pulsed neutron source

Citation Formats

Hu, Xuesong, Jiao, Xuesong, Narayanan, Suresh, Jiang, Zhang, K. Sinha, Sunil, Lurio, L. B., and Lal, Jyotsana. Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces. United States: N. p., 2005. Web. doi:10.1140/epje/i2004-10147-4.
Hu, Xuesong, Jiao, Xuesong, Narayanan, Suresh, Jiang, Zhang, K. Sinha, Sunil, Lurio, L. B., & Lal, Jyotsana. Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces. United States. https://doi.org/10.1140/epje/i2004-10147-4
Hu, Xuesong, Jiao, Xuesong, Narayanan, Suresh, Jiang, Zhang, K. Sinha, Sunil, Lurio, L. B., and Lal, Jyotsana. 2005. "Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces". United States. https://doi.org/10.1140/epje/i2004-10147-4.
@article{osti_876432,
title = {Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces},
author = {Hu, Xuesong and Jiao, Xuesong and Narayanan, Suresh and Jiang, Zhang and K. Sinha, Sunil and Lurio, L. B. and Lal, Jyotsana},
abstractNote = {We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.},
doi = {10.1140/epje/i2004-10147-4},
url = {https://www.osti.gov/biblio/876432}, journal = {European Physical Journal. E, Soft Matter},
issn = {1292-8941},
number = 3,
volume = 17,
place = {United States},
year = {Fri Jul 01 00:00:00 EDT 2005},
month = {Fri Jul 01 00:00:00 EDT 2005}
}