Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces
Abstract
We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.
- Authors:
- Publication Date:
- Research Org.:
- Intense Pulsed Neutron Source (IPNS), Argonne National Laboratory (ANL), Argonne, IL (US); Northern Illlinois Univ.; Univ. of California
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 876432
- DOE Contract Number:
- W-31-109-ENG-38
- Resource Type:
- Journal Article
- Journal Name:
- European Physical Journal. E, Soft Matter
- Additional Journal Information:
- Journal Volume: 17; Journal Issue: 3; Related Information: 2005; Journal ID: ISSN 1292-8941
- Publisher:
- EDP Sciences
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; POLYMERS; INTERFACES; X-RAY DIFFRACTION; SURFACE TENSION; intense pulsed neutron source
Citation Formats
Hu, Xuesong, Jiao, Xuesong, Narayanan, Suresh, Jiang, Zhang, K. Sinha, Sunil, Lurio, L. B., and Lal, Jyotsana. Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces. United States: N. p., 2005.
Web. doi:10.1140/epje/i2004-10147-4.
Hu, Xuesong, Jiao, Xuesong, Narayanan, Suresh, Jiang, Zhang, K. Sinha, Sunil, Lurio, L. B., & Lal, Jyotsana. Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces. United States. https://doi.org/10.1140/epje/i2004-10147-4
Hu, Xuesong, Jiao, Xuesong, Narayanan, Suresh, Jiang, Zhang, K. Sinha, Sunil, Lurio, L. B., and Lal, Jyotsana. 2005.
"Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces". United States. https://doi.org/10.1140/epje/i2004-10147-4.
@article{osti_876432,
title = {Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces},
author = {Hu, Xuesong and Jiao, Xuesong and Narayanan, Suresh and Jiang, Zhang and K. Sinha, Sunil and Lurio, L. B. and Lal, Jyotsana},
abstractNote = {We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.},
doi = {10.1140/epje/i2004-10147-4},
url = {https://www.osti.gov/biblio/876432},
journal = {European Physical Journal. E, Soft Matter},
issn = {1292-8941},
number = 3,
volume = 17,
place = {United States},
year = {Fri Jul 01 00:00:00 EDT 2005},
month = {Fri Jul 01 00:00:00 EDT 2005}
}
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