Selective flow path alpha particle detector and method of use

Patent · Tue Jan 01 00:00:00 EST 2002

OSTI ID:874764

Orr, Christopher Henry ^[1]; Luff, Craig Janson ^[1]; Dockray, Thomas ^[1]; Macarthur, Duncan Whittemore ^[2]

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1. Sellafield, Seascale, Cumbria, GB
2. P.O. Box 1663, Los Alamos, NM 87545

A method and apparatus for monitoring alpha contamination are provided in which ions generated in the air surrounding the item, by the passage of alpha particles, are moved to a distant detector location. The parts of the item from which ions are withdrawn can be controlled by restricting the air flow over different portions of the apparatus. In this way, detection of internal and external surfaces separately, for instance, can be provided. The apparatus and method are particularly suited for use in undertaking alpha contamination measurements during the commissioning operations.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• DOE Contract Number: W-7405-ENG-36
• Assignee: Orr; Christopher Henry (Sellafield, Seascale, Cumbria, GB); Luff; Craig Janson (Sellafield, Seascale, Cumbria, GB); Dockray; Thomas (Sellafield, Seascale, Cumbria, GB); Macarthur; Duncan Whittemore (P.O. Box 1663, Los Alamos, NM 87545)
• Patent Number(s): US 6455859
• OSTI ID: 874764
• Country of Publication: United States
• Language: English

Related Subjects

selective
flow
path
alpha
particle
detector
method
apparatus
monitoring
contamination
provided
generated
air
surrounding
item
passage
particles
moved
distant
location
withdrawn
controlled
restricting
portions
detection
internal
external
surfaces
separately
instance
suited
undertaking
measurements
commissioning
operations
air flow
flow path
external surface
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