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Title: Hyperbaric hydrothermal atomic force microscope

Patent ·
OSTI ID:874670

A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
DOE Contract Number:
W-7405-ENG-48
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Number(s):
US 6437328
OSTI ID:
874670
Country of Publication:
United States
Language:
English

References (6)

Dissolution Kinetics of the Barium Sulfate (001) Surface by Hydrothermal Atomic Force Microscopy journal September 1998
An in-situ hot stage for temperature-dependent tapping-mode™ atomic force microscopy journal September 1998
Dissolution of Baryte (001) Observed by Hydrothermal Scanning Force Microscopy journal January 1998
In-Situ Observation of Oxide and Silicate Mineral Dissolution by Hydrothermal Scanning Force Microscopy: Initial Results for Hematite and Albite journal January 1998
Temperature controlled microstage for an atomic force microscope journal July 1996
A hydrothermal atomic force microscope for imaging in aqueous solution up to 150 °C journal August 1998