Method for forming a barrier layer
Patent
·
OSTI ID:874201
- Baltimore, MD
Cubic or metastable cubic refractory metal carbides act as barrier layers to isolate, adhere, and passivate copper in semiconductor fabrication. One or more barrier layers of the metal carbide are deposited in conjunction with copper metallizations to form a multilayer characterized by a cubic crystal structure with a strong (100) texture. Suitable barrier layer materials include refractory transition metal carbides such as vanadium carbide (VC), niobium carbide (NbC), tantalum carbide (TaC), chromium carbide (Cr.sub.3 C.sub.2), tungsten carbide (WC), and molybdenum carbide (MoC).
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Number(s):
- US 6339020
- OSTI ID:
- 874201
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
/438/257/
100
adhere
barrier
carbide
carbides
characterized
chromium
conjunction
copper
crsub3
crystal
csub2
cubic
deposited
fabrication
form
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layer
layers
materials
metal
metal carbide
metallizations
metastable
method
moc
molybdenum
multilayer
nbc
niobium
passivate
refractory
semiconductor
semiconductor fabrication
strong
structure
tac
tantalum
texture
transition
transition metal
tungsten
vanadium
vc
wc
100
adhere
barrier
carbide
carbides
characterized
chromium
conjunction
copper
crsub3
crystal
csub2
cubic
deposited
fabrication
form
forming
isolate
layer
layers
materials
metal
metal carbide
metallizations
metastable
method
moc
molybdenum
multilayer
nbc
niobium
passivate
refractory
semiconductor
semiconductor fabrication
strong
structure
tac
tantalum
texture
transition
transition metal
tungsten
vanadium
vc
wc