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Title: Optical method for the determination of grain orientation in films

Abstract

A method for the determination of grain orientation in a film sample is provided comprising the steps of measuring a first transient optical response of the film and determining the contribution to the transient optical response arising from a change in the energy distribution of the electrons in the sample, determining the contribution to the transient optical response arising from a propagating strain pulse within the sample, and determining the contribution to the transient optical response arising from a change in sample temperature of the sample. The grain orientation of the sample may be determined using the contributions to the transient optical response arising from the change in the energy distribution of the electrons, the propagating strain pulse, and the change in sample temperature. Additionally, a method for determination of the thickness of a film sample is provided. The grain orientation of the sample is first determined. The grain orientation, together with the velocity of sound and a propagation time of a strain pulse through the sample are then used to determine the thickness of the film sample.

Inventors:
 [1]
  1. Barrington, RI
Publication Date:
Research Org.:
Brown Univ., Providence, RI (United States)
OSTI Identifier:
874121
Patent Number(s):
US 6317216
Assignee:
Brown University Research Foundation (Providence, RI)
DOE Contract Number:  
FG02-86ER45267
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
optical; method; determination; grain; orientation; films; film; sample; provided; comprising; steps; measuring; transient; response; determining; contribution; arising; change; energy; distribution; electrons; propagating; strain; pulse; temperature; determined; contributions; additionally; thickness; velocity; sound; propagation; time; determine; energy distribution; optical method; grain orientation; film sample; /356/

Citation Formats

Maris, Humphrey J. Optical method for the determination of grain orientation in films. United States: N. p., 2001. Web.
Maris, Humphrey J. Optical method for the determination of grain orientation in films. United States.
Maris, Humphrey J. 2001. "Optical method for the determination of grain orientation in films". United States. https://www.osti.gov/servlets/purl/874121.
@article{osti_874121,
title = {Optical method for the determination of grain orientation in films},
author = {Maris, Humphrey J},
abstractNote = {A method for the determination of grain orientation in a film sample is provided comprising the steps of measuring a first transient optical response of the film and determining the contribution to the transient optical response arising from a change in the energy distribution of the electrons in the sample, determining the contribution to the transient optical response arising from a propagating strain pulse within the sample, and determining the contribution to the transient optical response arising from a change in sample temperature of the sample. The grain orientation of the sample may be determined using the contributions to the transient optical response arising from the change in the energy distribution of the electrons, the propagating strain pulse, and the change in sample temperature. Additionally, a method for determination of the thickness of a film sample is provided. The grain orientation of the sample is first determined. The grain orientation, together with the velocity of sound and a propagation time of a strain pulse through the sample are then used to determine the thickness of the film sample.},
doi = {},
url = {https://www.osti.gov/biblio/874121}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2001},
month = {1}
}

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