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Title: Transmission electron microscope CCD camera

Abstract

In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.

Inventors:
 [1]
  1. (Lafayette, CA)
Publication Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA
OSTI Identifier:
872737
Patent Number(s):
US 5998790
Assignee:
Regents of University of California (Oakland, CA) LBNL
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
transmission; electron; microscope; ccd; camera; improve; performance; voltage; decelerator; inserted; column; arrangement; optimizes; interaction; beam; scintillator; retaining; optimization; optics; specimen; changing; energy; allows; optimized; ccd camera; electron microscope; electron beam; beam energy; transmission electron; voltage electron; /250/

Citation Formats

Downing, Kenneth H. Transmission electron microscope CCD camera. United States: N. p., 1999. Web.
Downing, Kenneth H. Transmission electron microscope CCD camera. United States.
Downing, Kenneth H. Fri . "Transmission electron microscope CCD camera". United States. doi:. https://www.osti.gov/servlets/purl/872737.
@article{osti_872737,
title = {Transmission electron microscope CCD camera},
author = {Downing, Kenneth H.},
abstractNote = {In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 1999},
month = {Fri Jan 01 00:00:00 EST 1999}
}

Patent:

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