Optical method for determining the mechanical properties of a material

Maris, Humphrey J; Stoner, Robert J

Title: Optical method for determining the mechanical properties of a material

Patent · Thu Jan 01 00:00:00 EST 1998

OSTI ID:872015

Maris, Humphrey J ^[1]; Stoner, Robert J ^[2]

Barrington, RI
Duxbury, MA

Disclosed is a method for characterizing a sample, comprising the steps of: (a) acquiring data from the sample using at least one probe beam wavelength to measure, for times less than a few nanoseconds, a change in the reflectivity of the sample induced by a pump beam; (b) analyzing the data to determine at least one material property by comparing a background signal component of the data with data obtained for a similar delay time range from one or more samples prepared under conditions known to give rise to certain physical and chemical material properties; and (c) analyzing a component of the measured time dependent reflectivity caused by ultrasonic waves generated by the pump beam using the at least one determined material property. The first step of analyzing may include a step of interpolating between reference samples to obtain an intermediate set of material properties. The material properties may include sound velocity, density, and optical constants. In one embodiment, only a correlation is made with the background signal, and at least one of the structural phase, grain orientation, and stoichiometry is determined.

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Research Organization:: Brown Univ., Providence, RI (United States)

DOE Contract Number:: FG02-86ER45267

Assignee:: Brown University Research Foundation (Providence, RI)

Patent Number(s):: US 5844684

OSTI ID:: 872015

Country of Publication:: United States

Language:: English

References (38)

Nondestructive detection of titanium disilicide phase transformation by picosecond ultrasonics Lin, H. ‐N.; Stoner, R. J.; Maris, H. J. Applied Physics Letters, Vol. 61, Issue 22 https://doi.org/10.1063/1.108114	journal	November 1992
Ion implant monitoring with thermal wave technology Smith, W. Lee; Rosencwaig, Allan; Willenborg, David L. Applied Physics Letters, Vol. 47, Issue 6 https://doi.org/10.1063/1.96079	journal	September 1985
Study of vibrational modes of gold nanostructures by picosecond ultrasonics Lin, H. ‐N.; Maris, H. J.; Freund, L. B. Journal of Applied Physics, Vol. 73, Issue 1 https://doi.org/10.1063/1.353859	journal	January 1993
Picosecond Ellipsometry of Transient Electron-Hole Plasmas in Germanium Auston, D. H.; Shank, C. V. Physical Review Letters, Vol. 32, Issue 20 https://doi.org/10.1103/PhysRevLett.32.1120	journal	May 1974
Picosecond acoustics as a non-destructive tool for the characterization of very thin films Thomsen, C.; Maris, H. J.; Tauc, J. Thin Solid Films, Vol. 154, Issue 1-2 https://doi.org/10.1016/0040-6090(87)90366-X	journal	November 1987
Sound velocity and index of refraction of AlAs measured by picosecond ultrasonics Grahn, H. T.; Young, D. A.; Maris, H. J. Applied Physics Letters, Vol. 53, Issue 21 https://doi.org/10.1063/1.100309	journal	November 1988
Characterization of Transparent and Opaque thin Films Using Laser Picosecond Ultrasonics Wright, O. B.; Hyoguchi, T.; Kawashima, K. Nondestructive Testing and Evaluation, Vol. 7, Issue 1-6 https://doi.org/10.1080/10589759208952995	journal	June 1992
Carrier lifetime versus ion‐implantation dose in silicon on sapphire Doany, F. E.; Grischkowsky, D.; Chi, C. ‐C. Applied Physics Letters, Vol. 50, Issue 8 https://doi.org/10.1063/1.98173	journal	February 1987
Generation and detection of picosecond acoustic pulses in thin metal films Eesley, Gary L.; Clemens, Bruce M.; Paddock, Carolyn A. Applied Physics Letters, Vol. 50, Issue 12 https://doi.org/10.1063/1.98077	journal	March 1987
Laser Picosecond Acoustics in Various Types of Thin Film Wright, Oliver B.; Hyoguchi, Takao; Kawashima, Katsuhiro Japanese Journal of Applied Physics, Vol. 31, Issue S1 https://doi.org/10.7567/JJAPS.31S1.85	journal	January 1992
Analysis of lattice defects induced by ion implantation with photo‐acoustic displacement measurements Sumie, Shingo; Takamatsu, Hiroyuki; Morimoto, Tsutomu Journal of Applied Physics, Vol. 76, Issue 10 https://doi.org/10.1063/1.357074	journal	November 1994
Transient thermoreflectance from thin metal films Paddock, Carolyn A.; Eesley, Gary L. Journal of Applied Physics, Vol. 60, Issue 1, p. 285-290 https://doi.org/10.1063/1.337642	journal	July 1986
Measurements of the Kapitza conductance between diamond and several metals Stoner, R. J.; Maris, H. J.; Anthony, T. R. Physical Review Letters, Vol. 68, Issue 10 https://doi.org/10.1103/PhysRevLett.68.1563	journal	March 1992
High Resolution Laser Picosecond Acoustics in Thin Films Wright, O. B.; Matsumoto, T.; Hyoguchi, T. Physical Acoustics, p. 695-702 https://doi.org/10.1007/978-1-4615-9573-1_94	book	January 1991
Kapitza conductance and heat flow between solids at temperatures from 50 to 300 K Stoner, R. J.; Maris, H. J. Physical Review B, Vol. 48, Issue 22 https://doi.org/10.1103/PhysRevB.48.16373	journal	December 1993
Time-resolved study of vibrations of a -Ge:H/ a -Si:H multilayers Grahn, H. T.; Maris, H. J.; Tauc, J. Physical Review B, Vol. 38, Issue 9 https://doi.org/10.1103/PhysRevB.38.6066	journal	September 1988
Detection of Thin Interfacial Layers by Picosecond Ultrasonics Tas, G.; Stoner, R. J.; Maris, H. J. MRS Proceedings, Vol. 259 https://doi.org/10.1557/PROC-259-231	journal	January 1992
Ultrasonic experiments at ultra-high frequency with picosecond time-resolution Lin, H. -N.; Stoner, R. J.; Maris, H. J. IEEE Symposium on Ultrasonics https://doi.org/10.1109/ULTSYM.1990.171573	conference	January 1990
Thickness and sound velocity measurement in thin transparent films with laser picosecond acoustics Wright, O. B. Journal of Applied Physics, Vol. 71, Issue 4 https://doi.org/10.1063/1.351218	journal	February 1992
Physics of ultrafast phenomena in solid state plasmas Elci, Ahmet; Smirl, Arthur L.; Leung, C. Y. Solid-State Electronics, Vol. 21, Issue 1 https://doi.org/10.1016/0038-1101(78)90130-2	journal	January 1978
Nondestructive testing of microstructures by picosecond ultrasonics Lin, H. -N.; Stoner, R. J.; Maris, H. J. Journal of Nondestructive Evaluation, Vol. 9, Issue 4 https://doi.org/10.1007/BF00565642	journal	December 1990
Detection of thermal waves through optical reflectance Rosencwaig, Allan; Opsal, Jon; Smith, W. L. Applied Physics Letters, Vol. 46, Issue 11 https://doi.org/10.1063/1.95794	journal	June 1985
Thermal and plasma wave depth profiling in silicon Opsal, Jon; Rosencwaig, Allan Applied Physics Letters, Vol. 47, Issue 5 https://doi.org/10.1063/1.96105	journal	September 1985
Surface generation and detection of phonons by picosecond light pulses Thomsen, C.; Grahn, H. T.; Maris, H. J. Physical Review B, Vol. 34, Issue 6 https://doi.org/10.1103/PhysRevB.34.4129	journal	September 1986
Phonon attenuation and velocity measurements in transparent materials by picosecond acoustic interferometry Lin, H. ‐N.; Stoner, R. J.; Maris, H. J. Journal of Applied Physics, Vol. 69, Issue 7 https://doi.org/10.1063/1.348958	journal	April 1991
Measurements of atomic sodium in flames by asynchronous optical sampling: theory and experiment Fiechtner, Gregory J.; King, Galen B.; Laurendeau, Normand M. Applied Optics, Vol. 31, Issue 15 https://doi.org/10.1364/AO.31.002849	journal	January 1992
Thin‐film thickness measurements with thermal waves Rosencwaig, Allan; Opsal, Jon; Willenborg, David L. Applied Physics Letters, Vol. 43, Issue 2 https://doi.org/10.1063/1.94267	journal	July 1983
Attenuation of longitudinal-acoustic phonons in amorphous ${SiO}_{2}$ at frequencies up to 440 GHz Zhu, T. C.; Maris, H. J.; Tauc, J. Physical Review B, Vol. 44, Issue 9 https://doi.org/10.1103/PhysRevB.44.4281	journal	September 1991
Noninvasive picosecond ultrasonic detection of ultrathin interfacial layers: CF _x at the Al/Si interface Tas, G.; Stoner, R. J.; Maris, H. J. Applied Physics Letters, Vol. 61, Issue 15 https://doi.org/10.1063/1.108427	journal	October 1992
Picosecond ultrasonics Grahn, H. T.; Maris, H. J.; Tauc, J. IEEE Journal of Quantum Electronics, Vol. 25, Issue 12 https://doi.org/10.1109/3.40643	journal	January 1989
Relationship between Interfacial Strain and the Elastic Response of Multilayer Metal Films Clemens, Bruce M.; Eesley, Gary L. Physical Review Letters, Vol. 61, Issue 20 https://doi.org/10.1103/PhysRevLett.61.2356	journal	November 1988
Picosecond spectroscopy of semiconductors Auston, D. H.; McAfee, S.; Shank, C. V. Solid-State Electronics, Vol. 21, Issue 1 https://doi.org/10.1016/0038-1101(78)90129-6	journal	January 1978
Picosecond optical studies of amorphous diamond and diamondlike carbon: Thermal conductivity and longitudinal sound velocity Morath, Christopher J.; Maris, Humphrey J.; Cuomo, Jerome J. Journal of Applied Physics, Vol. 76, Issue 5 https://doi.org/10.1063/1.357560	journal	September 1994
Asynchronous optical sampling:a new combustion diagnostic for potential use in turbulent, high-pressure flames Fiechtner, G. J.; Kneisler, R. J.; Lytle, F. E. Optics Letters, Vol. 14, Issue 5 https://doi.org/10.1364/OL.14.000260	journal	January 1989
Picosecond photoinduced electronic and acoustic effects in a-Si:H based multilayer structures Grahn, H. T.; Vardeny, Z.; Maris, H. J. Journal of Non-Crystalline Solids, Vol. 97-98 https://doi.org/10.1016/0022-3093(87)90205-5	journal	December 1987
Elastic properties of silicon oxynitride films determined by picosecond acoustics Grahn, H. T.; Maris, H. J.; Tauc, J. Applied Physics Letters, Vol. 53, Issue 23 https://doi.org/10.1063/1.100253	journal	December 1988
A New Method of Photothermal Displacement Measurement by Laser Interferometric Probe -Its Mechanism and Applications to Evaluation of Lattice Damage in Semiconductors Sumie, Shingo; Takamatsu, Hiroyuki; Nishimoto, Yoshiro Japanese Journal of Applied Physics, Vol. 31, Issue Part 1, No. 11 https://doi.org/10.1143/JJAP.31.3575	journal	November 1992
Studies of High-Frequency Acoustic Phonons Using Picosecond Optical Techniques Maris, H. J.; Thomsen, C.; Tauc, J. Phonon Scattering in Condensed Matter V, p. 374-380 https://doi.org/10.1007/978-3-642-82912-3_105	book	January 1986

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optical
method
determining
mechanical
properties
material
disclosed
characterizing
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comprising
steps
acquiring
data
probe
beam
wavelength
measure
times
nanoseconds
change
reflectivity
induced
pump
analyzing
determine
property
comparing
background
signal
component
obtained
similar
delay
time
range
samples
prepared
conditions
rise
physical
chemical
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dependent
caused
ultrasonic
waves
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determined
step
interpolating
reference
obtain
intermediate
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sound
velocity
density
constants
embodiment
correlation
structural
phase
grain
orientation
stoichiometry
ultrasonic wave
time dependent
waves generated
optical constants
optical method
probe beam
mechanical properties
material properties
data obtained
ultrasonic waves
pump beam
delay time
reference sample
measured time
sound velocity
grain orientation
chemical material
acquiring data
background signal
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/356/

Title: Optical method for determining the mechanical properties of a material

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