GaAs photoconductive semiconductor switch
Patent
·
OSTI ID:871826
- Sandia Park, NM
- Albuquerque, NM
A high gain, optically triggered, photoconductive semiconductor switch (PCSS) implemented in GaAs as a reverse-biased pin structure with a passivation layer above the intrinsic GaAs substrate in the gap between the two electrodes of the device. The reverse-biased configuration in combination with the addition of the passivation layer greatly reduces surface current leakage that has been a problem for prior PCSS devices and enables employment of the much less expensive and more reliable DC charging systems instead of the pulsed charging systems that needed to be used with prior PCSS devices.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA
- Sponsoring Organization:
- United States Department of Energy
- DOE Contract Number:
- AC04-94AL85000
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Number(s):
- US 5804815
- OSTI ID:
- 871826
- Country of Publication:
- United States
- Language:
- English
High Current Density Contacts for GaAs Photoconductive Semiconductor Switches
|
conference | January 1993 |
Similar Records
GaAs photoconductive semiconductor switch
Optically controlled current filamentation in GaAs photoconductive semiconductor switches
High gain GaAs Photoconductive Semiconductor Switches for impulse sources
Patent
·
1998
·
OSTI ID:672705
Optically controlled current filamentation in GaAs photoconductive semiconductor switches
Conference
·
1993
·
OSTI ID:10180817
High gain GaAs Photoconductive Semiconductor Switches for impulse sources
Conference
·
1994
·
OSTI ID:10190822
Related Subjects
/250/257/
addition
charging
combination
configuration
current
current leakage
dc
device
devices
electrodes
employment
enables
expensive
gaas
gaas substrate
gap
greatly
greatly reduce
greatly reduces
implemented
intrinsic
layer
leakage
optically
optically triggered
passivation
passivation layer
pcss
photoconductive
photoconductive semiconductor
prior
pulsed
reduces
reduces surface
reliable
reverse-biased
semiconductor
semiconductor switch
structure
substrate
surface
switch
systems
triggered
addition
charging
combination
configuration
current
current leakage
dc
device
devices
electrodes
employment
enables
expensive
gaas
gaas substrate
gap
greatly
greatly reduce
greatly reduces
implemented
intrinsic
layer
leakage
optically
optically triggered
passivation
passivation layer
pcss
photoconductive
photoconductive semiconductor
prior
pulsed
reduces
reduces surface
reliable
reverse-biased
semiconductor
semiconductor switch
structure
substrate
surface
switch
systems
triggered