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Title: Textured-surface quartz resonator fluid density and viscosity monitor

Abstract

A pair of thickness-shear mode resonators, one smooth and one with a textured surface, allows fluid density and viscosity to be independently resolved. A textured surface, either randomly rough or regularly patterned, leads to trapping of liquid at the device surface. The synchronous motion of this trapped liquid with the oscillating device surface allows the device to weigh the liquid; this leads to an additional response that depends on liquid density. This additional response enables a pair of devices, one smooth and one textured, to independently resolve liquid density and viscosity; the difference in responses determines the density while the smooth device determines the density-viscosity product, and thus, the pair determines both density and viscosity.

Inventors:
 [1];  [1];  [1];  [2];  [1];  [3];  [4]
  1. Albuquerque, NM
  2. Cedar Crest, NM
  3. Bernalillo, NM
  4. Tijeras, NM
Publication Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
OSTI Identifier:
871800
Patent Number(s):
US 5798452
Application Number:
08/846,085
Assignee:
Sandia Corporation (Albuquerque, NM)
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
textured-surface; quartz; resonator; fluid; density; viscosity; monitor; pair; thickness-shear; mode; resonators; smooth; textured; surface; allows; independently; resolved; randomly; regularly; patterned; leads; trapping; liquid; device; synchronous; motion; trapped; oscillating; weigh; additional; response; depends; enables; devices; resolve; difference; responses; determines; density-viscosity; product; device surface; surface allows; fluid density; textured surface; quartz resonator; oscillating device; allows fluid; liquid density; resonator fluid; mode resonators; density-viscosity product; viscosity monitor; thickness-shear mode; independently resolve; independently resolved; /73/

Citation Formats

Martin, Stephen J, Wiczer, James J, Cernosek, Richard W, Frye, Gregory C, Gebert, Charles T, Casaus, Leonard, and Mitchell, Mary A. Textured-surface quartz resonator fluid density and viscosity monitor. United States: N. p., 1998. Web.
Martin, Stephen J, Wiczer, James J, Cernosek, Richard W, Frye, Gregory C, Gebert, Charles T, Casaus, Leonard, & Mitchell, Mary A. Textured-surface quartz resonator fluid density and viscosity monitor. United States.
Martin, Stephen J, Wiczer, James J, Cernosek, Richard W, Frye, Gregory C, Gebert, Charles T, Casaus, Leonard, and Mitchell, Mary A. 1998. "Textured-surface quartz resonator fluid density and viscosity monitor". United States. https://www.osti.gov/servlets/purl/871800.
@article{osti_871800,
title = {Textured-surface quartz resonator fluid density and viscosity monitor},
author = {Martin, Stephen J and Wiczer, James J and Cernosek, Richard W and Frye, Gregory C and Gebert, Charles T and Casaus, Leonard and Mitchell, Mary A},
abstractNote = {A pair of thickness-shear mode resonators, one smooth and one with a textured surface, allows fluid density and viscosity to be independently resolved. A textured surface, either randomly rough or regularly patterned, leads to trapping of liquid at the device surface. The synchronous motion of this trapped liquid with the oscillating device surface allows the device to weigh the liquid; this leads to an additional response that depends on liquid density. This additional response enables a pair of devices, one smooth and one textured, to independently resolve liquid density and viscosity; the difference in responses determines the density while the smooth device determines the density-viscosity product, and thus, the pair determines both density and viscosity.},
doi = {},
url = {https://www.osti.gov/biblio/871800}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 25 00:00:00 EDT 1998},
month = {Tue Aug 25 00:00:00 EDT 1998}
}

Works referenced in this record:

Measuring liquid properties with smooth- and textured-surface resonators
conference, January 1993


Characterization of a quartz crystal microbalance with simultaneous mass and liquid loading
journal, October 1991