Method for the production of atomic ion species from plasma ion sources

Patent · 31 December 1997

OSTI ID:871759

Spence, David ^[1]; Lykke, Keith ^[2]

---

1. Hinsdale, IL
2. Woodridge, IL

A technique to enhance the yield of atomic ion species (H.sup.+, D.sup.+, O.sup.+, N.sup.+, etc.) from plasma ion sources. The technique involves the addition of catalyzing agents to the ion discharge. Effective catalysts include H.sub.2 O, D.sub.2 O, O.sub.2, and SF.sub.6, among others, with the most effective being water (H.sub.2 O) and deuterated water (D.sub.2 O). This technique has been developed at Argonne National Laboratory, where microwave generated plasmas have produced ion beams comprised of close to 100% purity protons (H.sup.+) and close to 100% purity deuterons (D.sup.+). The technique also increases the total yield of protons and deuterons by converting unwanted ion species, namely, H.sub.2.sup.+,H.sub.3.sup.+ and D.sub.2.sup.+, D.sub.3.sup.+, into the desired ion species, H.sup.+ and D.sup.+, respectively.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 5789744
• OSTI ID: 871759
• Country of Publication: United States
• Language: English

Related Subjects

/250/
100
addition
agents
argonne
atomic
beams
catalysts
catalyzing
close
comprised
converting
desired
deuterated
deuterons
developed
discharge
effective
effective catalyst
effective catalysts
enhance
etc
generated
increases
involves
laboratory
method
microwave
namely
national
national laboratory
plasma
plasmas
produced
production
protons
purity
respectively
sf
sources
species
technique
technique involves
total
unwanted
water
wave generated
yield