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Title: Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

Abstract

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

Inventors:
 [1];  [2];  [2];  [3]
  1. Berkeley, CA
  2. El Cerrito, CA
  3. Kowloon, CN
Publication Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
OSTI Identifier:
871508
Patent Number(s):
US 5744704
Assignee:
Regents, University of California (Oakland, CA)
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
apparatus; imaging; liquid; dielectric; materials; scanning; polarization; force; microscopy; images; forces; surfaces; induced; charged; microscope; sfm; probe; tip; insulators; major; contribution; surface; polarizability; frequencies; mobility; depends; strongly; humidity; inventive; films; droplets; weakly; adsorbed; imaged; liquid film; bed material; dielectric materials; probe tip; dielectric material; force microscope; force microscopy; scanning polarization; scanning force; charged scanning; liquid films; surfaces induced; images dielectric; imaging liquid; polarization forces; polarization force; dielectric polarization; /73/250/

Citation Formats

Hu, Jun, Ogletree, D Frank, Salmeron, Miguel, and Xiao, Xudong. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy. United States: N. p., 1998. Web.
Hu, Jun, Ogletree, D Frank, Salmeron, Miguel, & Xiao, Xudong. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy. United States.
Hu, Jun, Ogletree, D Frank, Salmeron, Miguel, and Xiao, Xudong. 1998. "Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy". United States. https://www.osti.gov/servlets/purl/871508.
@article{osti_871508,
title = {Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy},
author = {Hu, Jun and Ogletree, D Frank and Salmeron, Miguel and Xiao, Xudong},
abstractNote = {The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.},
doi = {},
url = {https://www.osti.gov/biblio/871508}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 1998},
month = {Thu Jan 01 00:00:00 EST 1998}
}