Process for preparing schottky diode contacts with predetermined barrier heights
- Middleton, WI
- Portland, OR
- Madison, WI
A process is provided for producing a Schottky diode having a preselected barrier height .phi..sub.Bn. The substrate is preferably n-GaAs, the metallic contact is derived from a starting alloy of the Formula [.SIGMA.M.sub..delta. ](Al.sub.x Ga.sub.1-x) wherein: .SIGMA.M is a moiety which consists of at least one M, and when more than one M is present, each M is different, M is a Group VIII metal selected from the group consisting of nickel, cobalt, ruthenium, rhodium, indium and platinum, .delta. is a stoichiometric coefficient whose total value in any given .SIGMA.M moiety is 1, and x is a positive number between 0 and 1 (that is, x ranges from greater than 0 to less than 1). Also, the starting alloy is capable of forming with the substrate a two phase equilibrium reciprocal system of the binary alloy mixture [.SIGMA.M.sub..delta. ]Ga-[.SIGMA.M.sub..delta. ]Al-AlAs-GaAs. When members of an alloy subclass within this Formula are each preliminarily correlated with the barrier height .phi..sub.Bn of a contact producable therewith, then Schottky diodes of predetermined barrier heights are producable by sputtering and annealing. Further provided are the product Schottky diodes that are produced according to this process.
- Research Organization:
- University of Wisconsin
- DOE Contract Number:
- FG02-86ER45274
- Assignee:
- Wisconsin Alumni Research Foundation (Madison, WI)
- Patent Number(s):
- US 5516725
- OSTI ID:
- 870414
- Country of Publication:
- United States
- Language:
- English
Similar Records
Group-III nitride based high electron mobility transistor (HEMT) with barrier/spacer layer
High Schottky barrier height of the Al/{ital n}-GaAs diodes achieved by sputter deposition
Related Subjects
1-x
according
al-alas-gaas
alloy
annealing
barrier
barrier height
binary
bn
capable
cobalt
coefficient
consisting
consists
contact
contacts
correlated
delta
derived
diode
diodes
equilibrium
forming
formula
ga-
height
heights
indium
metal
metal selected
metallic
metallic contact
mixture
moiety
n-gaas
nickel
phase
phi
platinum
positive
predetermined
preferably
preliminarily
preparing
preselected
process
producable
produced
produced according
producing
product
provided
ranges
reciprocal
rhodium
ruthenium
schottky
schottky diode
selected
sigma
sputtering
starting
stoichiometric
subclass
substrate
therewith
total
value
viii
viii metal