Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles

Patent · Sun Jan 01 00:00:00 EST 1995

OSTI ID:869897

Carpenter, Donald A ^[1]

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1. Lenior City, TN

A nondestructive method, and associated apparatus, are provided for determining the grain flow of the grains in a convex curved, textured polycrystalline surface. The convex, curved surface of a polycrystalline article is aligned in a horizontal x-ray diffractometer and a monochromatic, converging x-ray beam is directed onto the curved surface of the polycrystalline article so that the converging x-ray beam is diffracted by crystallographic planes of the grains in the polycrystalline article. The diffracted x-ray beam is caused to pass through a set of horizontal, parallel slits to limit the height of the beam and thereafter. The linear intensity of the diffracted x-ray is measured, using a linear position sensitive proportional counter, as a function of position in a direction orthogonal to the counter so as to generate two dimensional data. An image of the grains in the curved surface of the polycrystalline article is provided based on the two-dimensional data.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• DOE Contract Number: AC05-84OR21400
• Assignee: United States of America as represented by Department of Energy (Washington, DC)
• Patent Number(s): US 5418828
• OSTI ID: 869897
• Country of Publication: United States
• Language: English

Related Subjects

nondestructive
method
apparatus
imaging
grains
curved
surfaces
polycrystalline
articles
associated
provided
determining
grain
flow
convex
textured
surface
article
aligned
horizontal
x-ray
diffractometer
monochromatic
converging
beam
directed
diffracted
crystallographic
planes
caused
pass
set
parallel
slits
limit
height
thereafter
linear
intensity
measured
position
sensitive
proportional
counter
function
direction
orthogonal
generate
dimensional
data
image
based
two-dimensional
nondestructive method
curved surface
proportional counter
x-ray beam
position sensitive
curved surfaces
dimensional data
sensitive proportional
provided based
linear intensity
x-ray diffractometer
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