Process and apparatus for measuring degree of polarization and angle of major axis of polarized beam of light

Patent · Sat Jan 01 00:00:00 EST 1994

OSTI ID:869567

Decker, Derek E ^[1]; Toeppen, John S ^[2]

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1. Carmel, CA
2. Livermore, CA

Apparatus and process are disclosed for calibrating measurements of the phase of the polarization of a polarized beam and the angle of the polarized optical beam's major axis of polarization at a diagnostic point with measurements of the same parameters at a point of interest along the polarized beam path prior to the diagnostic point. The process is carried out by measuring the phase angle of the polarization of the beam and angle of the major axis at the point of interest, using a rotatable polarizer and a detector, and then measuring these parameters again at a diagnostic point where a compensation apparatus, including a partial polarizer, which may comprise a stack of glass plates, is disposed normal to the beam path between a rotatable polarizer and a detector. The partial polarizer is then rotated both normal to the beam path and around the axis of the beam path until the detected phase of the beam polarization equals the phase measured at the point of interest. The rotatable polarizer at the diagnostic point may then be rotated manually to determine the angle of the major axis of the beam and this is compared with the measured angle of the major axis of the beam at the point of interest during calibration. Thereafter, changes in the polarization phase, and in the angle of the major axis, at the point of interest can be monitored by measuring the changes in these same parameters at the diagnostic point.

• Research Organization: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
• DOE Contract Number: W-7405-ENG-48
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 5357342
• OSTI ID: 869567
• Country of Publication: United States
• Language: English

Related Subjects

process
apparatus
measuring
degree
polarization
angle
major
axis
polarized
beam
light
disclosed
calibrating
measurements
phase
optical
diagnostic
parameters
path
prior
carried
rotatable
polarizer
detector
compensation
including
partial
comprise
stack
glass
plates
disposed
normal
rotated
detected
equals
measured
manually
determine
compared
calibration
thereafter
changes
monitored
major axis
optical beam
phase angle
beam path
polarized beam
glass plates
glass plate
detected phase
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