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Title: Superlattice strain gage

Abstract

A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element.

Inventors:
 [1];  [2];  [2]
  1. (Espanola, NM)
  2. (Los Alamos, NM)
Publication Date:
Research Org.:
Los Alamos National Laboratory (LANL), Los Alamos, NM
OSTI Identifier:
867314
Patent Number(s):
US 4912355
Assignee:
United States of America as represented by United States (Washington, DC) LANL
DOE Contract Number:
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
superlattice; strain; gage; comprising; strained-layer; crystal; exhibiting; piezoelectric; properties; described; substrate; deposited; attached; element; monitored; light; source; focused; reflected; passed; emitted; gathered; compared; previously; obtained; optical; property; data; determine; strained-layer superlattice; light reflected; light source; strain gage; optical property; superlattice crystal; layer superlattice; lattice strain; /310/73/

Citation Formats

Noel, Bruce W., Smith, Darryl L., and Sinha, Dipen N.. Superlattice strain gage. United States: N. p., 1990. Web.
Noel, Bruce W., Smith, Darryl L., & Sinha, Dipen N.. Superlattice strain gage. United States.
Noel, Bruce W., Smith, Darryl L., and Sinha, Dipen N.. Mon . "Superlattice strain gage". United States. doi:. https://www.osti.gov/servlets/purl/867314.
@article{osti_867314,
title = {Superlattice strain gage},
author = {Noel, Bruce W. and Smith, Darryl L. and Sinha, Dipen N.},
abstractNote = {A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 1990},
month = {Mon Jan 01 00:00:00 EST 1990}
}

Patent:

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