Method and apparatus for simultaneously measuring a plurality of spectral wavelengths present in electromagnetic radiation

Patent · Mon Jan 01 00:00:00 EST 1990

OSTI ID:867283

Buican, Tudor N ^[1]; Martin, John C ^[1]

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1. Los Alamos, NM

An apparatus and method simultaneously measures a plurality of spectral wavelengths present in electromagnetic radiation. A modulatable birefringent optical element is employed to divide a polarized light beam into two components, thereby producing a phase difference in two resulting light beams such that the two beams can be made to interfere with one another when recombined, the interference pattern providing the wavelength information required for the analysis of the incident light. The interferometer thus created performs in a similar manner to a Michelson interferometer, but with no moving parts, and with a resolution dependent on the degree of phase shift introduced by the modulator.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• DOE Contract Number: W-7405-ENG-36
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4905169
• OSTI ID: 867283
• Country of Publication: United States
• Language: English

Related Subjects

method
apparatus
simultaneously
measuring
plurality
spectral
wavelengths
electromagnetic
radiation
measures
modulatable
birefringent
optical
element
employed
divide
polarized
light
beam
components
producing
phase
difference
resulting
beams
interfere
recombined
interference
pattern
providing
wavelength
information
required
analysis
incident
interferometer
created
performs
similar
manner
michelson
moving
resolution
dependent
degree
shift
introduced
modulator
simultaneously measuring
incident light
interference pattern
phase difference
polarized light
phase shift
optical element
electromagnetic radiation
light beam
light beams
spectral wavelengths
michelson interferometer
simultaneously measure
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