Single event mass spectrometry

Patent · Tue Jan 16 00:00:00 EST 1990

OSTI ID:867246

Conzemius, Robert J ^[1]

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1. Ames, IA

A means and method for single event time of flight mass spectrometry for analysis of specimen materials. The method of the invention includes pulsing an ion source imposing at least one pulsed ion onto the specimen to produce a corresponding emission of at least one electrically charged particle. The emitted particle is then dissociated into a charged ion component and an uncharged neutral component. The ion and neutral components are then detected. The time of flight of the components are recorded and can be used to analyze the predecessor of the components, and therefore the specimen material. When more than one ion particle is emitted from the specimen per single ion impact, the single event time of flight mass spectrometer described here furnis This invention was made with Government support under Contract No. W-7405-ENG82 awarded by the Department of Energy. The Government has certain rights in the invention.

• Research Organization: Ames Laboratory (AMES), Ames, IA; Iowa State Univ., Ames, IA (United States)
• DOE Contract Number: W-7405-ENG-82
• Assignee: Iowa State University Research Foundation, Inc. (Ames, IA)
• Patent Number(s): US 4894536
• Application Number: 07/124,023
• OSTI ID: 867246
• Country of Publication: United States
• Language: English

Related Subjects

single
event
mass
spectrometry
means
method
time
flight
analysis
specimen
materials
pulsing
source
imposing
pulsed
produce
corresponding
emission
electrically
charged
particle
emitted
dissociated
component
uncharged
neutral
components
detected
recorded
analyze
predecessor
material
impact
spectrometer
described
furnis
government
support
contract
w-7405-eng82
awarded
department
energy
rights
mass spectrometer
charged particle
mass spectrometry
electrically charged
single event
government support
specimen material
neutral component
flight mass
event time
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