Characterization of compounds by time-of-flight measurement utilizing random fast ions

Patent · Sun Jan 01 00:00:00 EST 1989

OSTI ID:866908

Conzemius, Robert J ^[1]

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1. Ames, IA

An apparatus for characterizing the mass of sample and daughter particles, comprising a source for providing sample ions; a fragmentation region wherein a fraction of the sample ions may fragment to produce daughter ion particles; an electrostatic field region held at a voltage level sufficient to effect ion-neutral separation and ion-ion separation of fragments from the same sample ion and to separate ions of different kinetic energy; a detector system for measuring the relative arrival times of particles; and processing means operatively connected to the detector system to receive and store the relative arrival times and operable to compare the arrival times with times detected at the detector when the electrostatic field region is held at a different voltage level and to thereafter characterize the particles. Sample and daughter particles are characterized with respect to mass and other characteristics by detecting at a particle detector the relative time of arrival for fragments of a sample ion at two different electrostatic voltage levels. The two sets of particle arrival times are used in conjunction with the known altered voltage levels to mathematically characterize the sample and daughter fragments. In an alternative embodiment the present invention may be used as a detector for a conventional mass spectrometer. In this embodiment, conventional mass spectrometry analysis is enhanced due to further mass resolving of the detected ions.

• Research Organization: Ames Laboratory (AMES), Ames, IA
• Sponsoring Organization: USDOE
• DOE Contract Number: W-7405-ENG-82
• Assignee: Iowa State University Research Foundation, Inc. (Ames, IA)
• Patent Number(s): US 4818862
• OSTI ID: 866908
• Country of Publication: United States
• Language: English

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characterization
compounds
time-of-flight
measurement
utilizing
random
fast
apparatus
characterizing
mass
sample
daughter
particles
comprising
source
providing
fragmentation
region
fraction
fragment
produce
electrostatic
field
held
voltage
level
sufficient
effect
ion-neutral
separation
ion-ion
fragments
separate
kinetic
energy
detector
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relative
arrival
times
processing
means
operatively
connected
receive
store
operable
compare
detected
thereafter
characterize
characterized
respect
characteristics
detecting
particle
time
levels
sets
conjunction
altered
mathematically
alternative
embodiment
conventional
spectrometer
spectrometry
analysis
enhanced
due
resolving
voltage levels
level sufficient
arrival times
mass spectrometer
alternative embodiment
mass spectrometry
kinetic energy
particle detector
operatively connected
electrostatic field
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voltage level
processing means
relative arrival
arrival time
conventional mass
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time-of-flight measurement
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