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Title: Infrared trace element detection system

Abstract

An infrared trace element detection system including an optical cell into which the sample fluid to be examined is introduced and removed. Also introduced into the optical cell is a sample beam of infrared radiation in a first wavelength band which is significantly absorbed by the trace element and a second wavelength band which is not significantly absorbed by the trace element for passage through the optical cell through the sample fluid. The output intensities of the sample beam of radiation are selectively detected in the first and second wavelength bands. The intensities of a reference beam of the radiation are similarly detected in the first and second wavelength bands. The sensed output intensity of the sample beam in one of the first and second wavelength bands is normalized with respect to the other and similarly, the intensity of the reference beam of radiation in one of the first and second wavelength bands is normalized with respect to the other. The normalized sample beam intensity and normalized reference beam intensity are then compared to provide a signal from which the amount of trace element in the sample fluid can be determined.

Inventors:
 [1];  [2];  [3]
  1. Concord, MA
  2. Bedford, MA
  3. Burlington, MA
Publication Date:
Research Org.:
Spectral Sciences Inc
OSTI Identifier:
866777
Patent Number(s):
US 4785184
Assignee:
Spectral Sciences, Inc. (Burlington, MA)
DOE Contract Number:  
AC02-83ER80085
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
infrared; trace; element; detection; including; optical; cell; sample; fluid; examined; introduced; removed; beam; radiation; wavelength; band; significantly; absorbed; passage; output; intensities; selectively; detected; bands; reference; similarly; sensed; intensity; normalized; respect; compared; provide; signal; amount; determined; optical cell; wavelength bands; beam intensity; trace element; reference beam; infrared radiation; sample fluid; wavelength band; sample beam; output intensity; element detection; infrared trace; /250/356/

Citation Formats

Bien, Fritz, Bernstein, Lawrence S, and Matthew, Michael W. Infrared trace element detection system. United States: N. p., 1988. Web.
Bien, Fritz, Bernstein, Lawrence S, & Matthew, Michael W. Infrared trace element detection system. United States.
Bien, Fritz, Bernstein, Lawrence S, and Matthew, Michael W. Fri . "Infrared trace element detection system". United States. https://www.osti.gov/servlets/purl/866777.
@article{osti_866777,
title = {Infrared trace element detection system},
author = {Bien, Fritz and Bernstein, Lawrence S and Matthew, Michael W},
abstractNote = {An infrared trace element detection system including an optical cell into which the sample fluid to be examined is introduced and removed. Also introduced into the optical cell is a sample beam of infrared radiation in a first wavelength band which is significantly absorbed by the trace element and a second wavelength band which is not significantly absorbed by the trace element for passage through the optical cell through the sample fluid. The output intensities of the sample beam of radiation are selectively detected in the first and second wavelength bands. The intensities of a reference beam of the radiation are similarly detected in the first and second wavelength bands. The sensed output intensity of the sample beam in one of the first and second wavelength bands is normalized with respect to the other and similarly, the intensity of the reference beam of radiation in one of the first and second wavelength bands is normalized with respect to the other. The normalized sample beam intensity and normalized reference beam intensity are then compared to provide a signal from which the amount of trace element in the sample fluid can be determined.},
doi = {},
url = {https://www.osti.gov/biblio/866777}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1988},
month = {1}
}

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