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Title: Method and apparatus for simultaneously measuring temperature and pressure

Abstract

Method and apparatus are provided for simultaneously measuring temperature and pressure in a class of crystalline materials having anisotropic thermal coefficients and having a coefficient of linear compression along the crystalline c-axis substantially the same as those perpendicular thereto. Temperature is determined by monitoring the fluorescence half life of a probe of such crystalline material, e.g., ruby. Pressure is determined by monitoring at least one other fluorescent property of the probe that depends on pressure and/or temperature, e.g., absolute fluorescent intensity or frequency shifts of fluorescent emission lines.

Inventors:
 [1];  [2]
  1. Livermore, CA
  2. Pleasanton, CA
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
OSTI Identifier:
866708
Patent Number(s):
US 4768886
Assignee:
Regents of University of California (Berkeley, CA)
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; simultaneously; measuring; temperature; pressure; provided; crystalline; materials; anisotropic; thermal; coefficients; coefficient; linear; compression; c-axis; substantially; perpendicular; thereto; determined; monitoring; fluorescence; half; life; probe; material; ruby; fluorescent; property; depends; absolute; intensity; frequency; shifts; emission; lines; simultaneously measuring; perpendicular thereto; measuring temperature; crystalline materials; frequency shift; crystalline material; emission line; thermal coefficient; c-axis substantially; emission lines; half life; fluorescent emission; thermal coefficients; anisotropic thermal; axis substantially; /374/73/

Citation Formats

Hirschfeld, Tomas B, and Haugen, Gilbert R. Method and apparatus for simultaneously measuring temperature and pressure. United States: N. p., 1988. Web.
Hirschfeld, Tomas B, & Haugen, Gilbert R. Method and apparatus for simultaneously measuring temperature and pressure. United States.
Hirschfeld, Tomas B, and Haugen, Gilbert R. Fri . "Method and apparatus for simultaneously measuring temperature and pressure". United States. https://www.osti.gov/servlets/purl/866708.
@article{osti_866708,
title = {Method and apparatus for simultaneously measuring temperature and pressure},
author = {Hirschfeld, Tomas B and Haugen, Gilbert R},
abstractNote = {Method and apparatus are provided for simultaneously measuring temperature and pressure in a class of crystalline materials having anisotropic thermal coefficients and having a coefficient of linear compression along the crystalline c-axis substantially the same as those perpendicular thereto. Temperature is determined by monitoring the fluorescence half life of a probe of such crystalline material, e.g., ruby. Pressure is determined by monitoring at least one other fluorescent property of the probe that depends on pressure and/or temperature, e.g., absolute fluorescent intensity or frequency shifts of fluorescent emission lines.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1988},
month = {1}
}

Patent:

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