Method and apparatus for simultaneously measuring temperature and pressure

Patent · 31 December 1987

OSTI ID:866708

Hirschfeld, Tomas B ^[1]; Haugen, Gilbert R ^[2]

---

1. Livermore, CA
2. Pleasanton, CA

Method and apparatus are provided for simultaneously measuring temperature and pressure in a class of crystalline materials having anisotropic thermal coefficients and having a coefficient of linear compression along the crystalline c-axis substantially the same as those perpendicular thereto. Temperature is determined by monitoring the fluorescence half life of a probe of such crystalline material, e.g., ruby. Pressure is determined by monitoring at least one other fluorescent property of the probe that depends on pressure and/or temperature, e.g., absolute fluorescent intensity or frequency shifts of fluorescent emission lines.

• Research Organization: Lawrence Livermore National Laboratory (LLNL), Livermore, CA
• DOE Contract Number: W-7405-ENG-48
• Assignee: Regents of University of California (Berkeley, CA)
• Patent Number(s): US 4768886
• OSTI ID: 866708
• Country of Publication: United States
• Language: English

Related Subjects

/374/73/
absolute
anisotropic
anisotropic thermal
apparatus
axis substantially
c-axis
c-axis substantially
coefficient
coefficients
compression
crystalline
crystalline material
crystalline materials
depends
determined
emission
emission line
emission lines
fluorescence
fluorescent
fluorescent emission
frequency
frequency shift
half
half life
intensity
life
linear
lines
material
materials
measuring
measuring temperature
method
monitoring
perpendicular
perpendicular thereto
pressure
probe
property
provided
ruby
shifts
simultaneously
simultaneously measuring
substantially
temperature
thereto
thermal
thermal coefficient
thermal coefficients