Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom

Patent · Fri Jan 01 00:00:00 EST 1988

OSTI ID:866679

Johnston, Roger G ^[1]

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1. Los Alamos, NM

Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom. Differential phase measurements on scattered light from particles are possible using the two-frequency Zeeman effect laser which emits two frequencies of radiation 250 kHz apart. Excellent discrimination and reproducibility for various pure pollen and bacterial samples in suspension have been observed with a single polarization element. Additionally, a 250 kHz beat frequency was recorded from an individual particle traversing the focused output from the laser in a flow cytometer.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• DOE Contract Number: W-7405-ENG-36
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4764013
• OSTI ID: 866679
• Country of Publication: United States
• Language: English

Related Subjects

interferometric
apparatus
method
detection
characterization
particles
light
scattered
therefrom
differential
phase
measurements
two-frequency
zeeman
effect
laser
emits
frequencies
radiation
250
khz
apart
excellent
discrimination
reproducibility
various
pure
pollen
bacterial
samples
suspension
observed
single
polarization
element
additionally
beat
frequency
recorded
individual
particle
traversing
focused
output
flow
cytometer
individual particle
light scattered
scattered light
flow cytometer
beat frequency
phase measurement
differential phase
scattered therefrom
interferometric apparatus
/356/