Infrared microscope inspection apparatus

Patent · Tue Feb 26 00:00:00 EST 1985

OSTI ID:865358

Forman, Steven E ^[1]; Caunt, James W ^[2]

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1. Framingham, MA
2. Concord, MA

Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface.

• Research Organization: Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
• DOE Contract Number: AC02-76ET20279
• Assignee: Massachusetts Institute of Technology (Cambridge, MA)
• Patent Number(s): US 4501966
• Application Number: 06/243,415
• OSTI ID: 865358
• Country of Publication: United States
• Language: English

Related Subjects

infrared
microscope
inspection
apparatus
inspecting
transparents
array
photovoltaic
modules
containing
silicon
solar
cells
sources
light
placed
axes
intersect
center
field
means
sending
reflected
adapted
mounted
x-y
translator
positioned
adjacent
surface
infrared light
photovoltaic modules
photovoltaic module
solar cell
solar cells
silicon solar
positioned adjacent
reflected light
inspection apparatus
modules containing
containing silicon
infrared microscope
infrared transparent
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