Latin square three dimensional gage master

Patent · Fri Jan 01 00:00:00 EST 1982

OSTI ID:864438

Jones, Lynn L ^[1]

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1. Lexena, KS

A gage master for coordinate measuring machines has an nxn array of objects distributed in the Z coordinate utilizing the concept of a Latin square experimental design. Using analysis of variance techniques, the invention may be used to identify sources of error in machine geometry and quantify machine accuracy.

• Research Organization: Kansas City Plant (KCP), Kansas City, MO (United States)
• DOE Contract Number: AC04-76DP00613
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4364182
• OSTI ID: 864438
• Country of Publication: United States
• Language: English

Related Subjects

latin
square
dimensional
gage
master
coordinate
measuring
machines
nxn
array
distributed
z
utilizing
concept
experimental
design
analysis
variance
techniques
identify
sources
error
machine
geometry
quantify
accuracy
measuring machine
coordinate measuring
measuring machines
gage master
latin square
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