Method and apparatus for detecting and measuring trace impurities in flowing gases

Patent · 01 January 1979

OSTI ID:863324

Taylor, Gene W ^[1]; Dowdy, Edward J ^[1]

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1. Los Alamos, NM

Trace impurities in flowing gases may be detected and measured by a dynamic atomic molecular emission spectrograph utilizing as its energy source the energy transfer reactions of metastable species, atomic or molecular, with the impurities in the flowing gas. An electronically metastable species which maintains a stable afterglow is formed and mixed with the flowing gas in a region downstream from and separate from the region in which the metastable species is formed. Impurity levels are determined quantitatively by the measurement of line and/or band intensity as a function of concentration employing emission spectroscopic techniques.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4148612
• OSTI ID: 863324
• Country of Publication: United States
• Language: English

Related Subjects

/436/356/422/
afterglow
apparatus
atomic
band
concentration
detected
detecting
determined
downstream
dynamic
electronically
emission
employing
energy
energy source
energy transfer
flowing
flowing gas
flowing gases
formed
function
gas
gases
impurities
impurity
intensity
levels
line
maintains
measured
measurement
measuring
metastable
method
mixed
molecular
purity levels
quantitatively
reactions
region
separate
source
species
spectrograph
spectroscopic
stable
techniques
trace
trace impurities
transfer
transfer reaction
transfer reactions
utilizing