Differential auger spectrometry

Patent · 31 December 1975

OSTI ID:862584

Strongin, Myron; Varma, Matesh Narayan; Anne, Joshi

Differential Auger spectroscopy method for increasing the sensitivity of micro-Auger spectroanalysis of the surfaces of dilute alloys, by alternately periodically switching an electron beam back and forth between an impurity free reference sample and a test sample containing a trace impurity. The Auger electrons from the samples produce representative Auger spectrum signals which cancel to produce an Auger test sample signal corresponding to the amount of the impurity in the test samples.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States)
• Sponsoring Organization: US Atomic Energy Commission (AEC)
• Assignee: United States of America as represented by United States Energy (Washington, DC)
• Patent Number(s): 3,965,351
• Application Number: 05/519324
• OSTI ID: 862584
• Country of Publication: United States
• Language: English

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