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Title: Diagnostic Analysis of Silicon Strips Detector Readout in the ATLAS Semi-Conductor Tracker Module Production

Abstract

The ATLAS Semi-Conductor Tracker (SCT) Collaboration is currently in the production phase of fabricating and testing silicon strips modules for the ATLAS detector at the Large Hadron Collider being built at the CERN laboratory in Geneva, Switzerland. A small but relevant percentage of ICs developed a new set of defects after being mounted on hybrids that were not detected in the wafer screening. To minimize IC replacement and outright module failure, analysis methods were developed to study IC problems during the production of SCT modules. These analyses included studying wafer and hybrid data correlations to finely tune the selection of ICs and tests to utilize the ability to adjust front-end parameters of the IC in order to reduce the rejection and replacement rate of fabricated components. This paper will discuss a few examples of the problems encountered during the production of SCT hybrids and modules in the area of ICs performance, and will demonstrate the value of the flexibility built into the ABCD3T chip.

Authors:
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Director. Office of Science. Office of High Energy Physics; National Science Foundation (NSF)
OSTI Identifier:
843067
Report Number(s):
LBNL-56632
Journal ID: ISSN 0168-9002; NIMAER; R&D Project: PHYS50; TRN: US0602206
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Journal Article
Journal Name:
Nuclear Instruments and Methods in Physics Research, Section A
Additional Journal Information:
Journal Volume: 541; Journal Issue: 1-2; Other Information: Journal Publication Date: 04/01/2005; Journal ID: ISSN 0168-9002
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; CERN; DEFECTS; FLEXIBILITY; HADRONS; PERFORMANCE; PRODUCTION; SILICON; SWITZERLAND; TESTING

Citation Formats

Ciocio, Alessandra, and ATLAS SCT Collaboration. Diagnostic Analysis of Silicon Strips Detector Readout in the ATLAS Semi-Conductor Tracker Module Production. United States: N. p., 2004. Web.
Ciocio, Alessandra, & ATLAS SCT Collaboration. Diagnostic Analysis of Silicon Strips Detector Readout in the ATLAS Semi-Conductor Tracker Module Production. United States.
Ciocio, Alessandra, and ATLAS SCT Collaboration. 2004. "Diagnostic Analysis of Silicon Strips Detector Readout in the ATLAS Semi-Conductor Tracker Module Production". United States. https://www.osti.gov/servlets/purl/843067.
@article{osti_843067,
title = {Diagnostic Analysis of Silicon Strips Detector Readout in the ATLAS Semi-Conductor Tracker Module Production},
author = {Ciocio, Alessandra and ATLAS SCT Collaboration},
abstractNote = {The ATLAS Semi-Conductor Tracker (SCT) Collaboration is currently in the production phase of fabricating and testing silicon strips modules for the ATLAS detector at the Large Hadron Collider being built at the CERN laboratory in Geneva, Switzerland. A small but relevant percentage of ICs developed a new set of defects after being mounted on hybrids that were not detected in the wafer screening. To minimize IC replacement and outright module failure, analysis methods were developed to study IC problems during the production of SCT modules. These analyses included studying wafer and hybrid data correlations to finely tune the selection of ICs and tests to utilize the ability to adjust front-end parameters of the IC in order to reduce the rejection and replacement rate of fabricated components. This paper will discuss a few examples of the problems encountered during the production of SCT hybrids and modules in the area of ICs performance, and will demonstrate the value of the flexibility built into the ABCD3T chip.},
doi = {},
url = {https://www.osti.gov/biblio/843067}, journal = {Nuclear Instruments and Methods in Physics Research, Section A},
issn = {0168-9002},
number = 1-2,
volume = 541,
place = {United States},
year = {Sun Oct 31 00:00:00 EDT 2004},
month = {Sun Oct 31 00:00:00 EDT 2004}
}