In situ synchrotron X-ray microdiffraction study of deformation behavior in polycrystalline coppers during uniaxial deformations

Journal Article · Thu Sep 30 00:00:00 EDT 2004 · Scripta Materialia

DOI:https://doi.org/10.1016/j.scriptamat.2004.07.003· OSTI ID:842110

Joo, H D; Kim, J S; Kim, K H; Tamura, N; Koo, Y M

The deformation behavior of pure copper polycrystals was investigated by in situ X-ray microdiffraction using synchrotron radiation. Tensile axis rotations of several positions of same grain were observed. Tensile axis movement depends on local position of a grain. This phenomenon may originate from the orientation relation between neighboring grains.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE Director. Office of Science. Office of Basic Energy Sciences. Materials Science and Engineering Division; Research Institute of Industrial Science and Technology, National Program for Tera-Level Nanodevices of the Ministry of Science and Technology (US)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 842110
• Report Number(s): LBNL-56405; SCMAF7; R&D Project: A580ES; TRN: US0503161
• Journal Information: Scripta Materialia, Vol. 51; Other Information: Journal Publication Date: December 2004; PBD: 30 Sep 2004; ISSN 1359-6462
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
36 MATERIALS SCIENCE
COPPER
DEFORMATION
ORIENTATION
POLYCRYSTALS
SYNCHROTRON RADIATION
SYNCHROTRONS
X-RAY MICRODIFFRACTION POLYCRYSTAL DEFORMATION COPPER