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Title: High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring, and Verification Efforts

Abstract

Non-invasive, high-resolution imaging of the shallow subsurface is needed for delineation of buried waste, detection of unexploded ordinance, verification and monitoring of containment structures, and other environmental applications. Electromagnetic measurements at frequencies between 1 and 100 MHz are important for such applications, because the induction number of many targets is small and the ability to determine the dielectric permittivity in addition to electrical conductivity of the subsurface is possible. Earlier workers were successful in developing systems for detecting anomalous areas, but no quantifiable information was accurately determined. For high-resolution imaging, accurate measurements are necessary so the field data can be mapped into the space of the subsurface parameters. We are developing a non-invasive method for accurately imaging the electrical conductivity and dielectric permittivity of the shallow subsurface using the plane wave impedance approach (Song et al., 1997). Electric and magnetic sensors are being tested in a known area against theoretical predictions, thereby insuring that the data collected with the high-frequency impedance (HFI) system will support high-resolution, multi-dimensional imaging techniques.

Authors:
;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab., Berkeley, CA; University of California, Berkeley, CA (US)
Sponsoring Org.:
USDOE Office of Environmental Management (EM) (US)
OSTI Identifier:
829933
Report Number(s):
EMSP-60328-2000
R&D Project: EMSP 60328; TRN: US200429%%90
Resource Type:
Technical Report
Resource Relation:
Other Information: PBD: 1 Jun 2000
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 54 ENVIRONMENTAL SCIENCES; CONTAINMENT; DETECTION; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; IMPEDANCE; INDUCTION; MONITORING; PERMITTIVITY; TARGETS; VERIFICATION

Citation Formats

Lee, Ki Ha, and Becker, Alex. High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring, and Verification Efforts. United States: N. p., 2000. Web. doi:10.2172/829933.
Lee, Ki Ha, & Becker, Alex. High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring, and Verification Efforts. United States. doi:10.2172/829933.
Lee, Ki Ha, and Becker, Alex. Thu . "High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring, and Verification Efforts". United States. doi:10.2172/829933. https://www.osti.gov/servlets/purl/829933.
@article{osti_829933,
title = {High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring, and Verification Efforts},
author = {Lee, Ki Ha and Becker, Alex},
abstractNote = {Non-invasive, high-resolution imaging of the shallow subsurface is needed for delineation of buried waste, detection of unexploded ordinance, verification and monitoring of containment structures, and other environmental applications. Electromagnetic measurements at frequencies between 1 and 100 MHz are important for such applications, because the induction number of many targets is small and the ability to determine the dielectric permittivity in addition to electrical conductivity of the subsurface is possible. Earlier workers were successful in developing systems for detecting anomalous areas, but no quantifiable information was accurately determined. For high-resolution imaging, accurate measurements are necessary so the field data can be mapped into the space of the subsurface parameters. We are developing a non-invasive method for accurately imaging the electrical conductivity and dielectric permittivity of the shallow subsurface using the plane wave impedance approach (Song et al., 1997). Electric and magnetic sensors are being tested in a known area against theoretical predictions, thereby insuring that the data collected with the high-frequency impedance (HFI) system will support high-resolution, multi-dimensional imaging techniques.},
doi = {10.2172/829933},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2000},
month = {6}
}

Technical Report:

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