On the feasibility to investigate point defects by advanced electron microscopy

Conference · Wed Oct 02 00:00:00 EDT 2002

OSTI ID:808947

Kisielowski, C; Jinschek, J R

Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced electron microscopes, it is feasible to promote experiments that aim to detect single atoms. This enables local investigations of non-stoichiometry. This paper reviews the current state-of-the-art.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE Director, Office of Science. Office of Basic Energy Sciences (US)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 808947
• Report Number(s): LBNL-52150; R&D Project: 501607; B& R KC0201010; TRN: US200307%%139
• Resource Relation: Conference: 4th Symposium on non-stoichiometric III-V compounds, Asilomar, CA (US), 10/02/2002--10/04/2002; Other Information: PBD: 2 Oct 2002
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMS
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
POINT DEFECTS
RESOLUTION
TRANSMISSION ELECTRON MICROSCOPY
HRTEM GAN NON-STOCHIOMETRT