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Title: On the feasibility to investigate point defects by advanced electron microscopy

Abstract

Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced electron microscopes, it is feasible to promote experiments that aim to detect single atoms. This enables local investigations of non-stoichiometry. This paper reviews the current state-of-the-art.

Authors:
;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Director, Office of Science. Office of Basic Energy Sciences (US)
OSTI Identifier:
808947
Report Number(s):
LBNL-52150
R&D Project: 501607; B& R KC0201010; TRN: US200307%%139
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Conference
Resource Relation:
Conference: 4th Symposium on non-stoichiometric III-V compounds, Asilomar, CA (US), 10/02/2002--10/04/2002; Other Information: PBD: 2 Oct 2002
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; POINT DEFECTS; RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY; HRTEM GAN NON-STOCHIOMETRT

Citation Formats

Kisielowski, C., and Jinschek, J.R. On the feasibility to investigate point defects by advanced electron microscopy. United States: N. p., 2002. Web.
Kisielowski, C., & Jinschek, J.R. On the feasibility to investigate point defects by advanced electron microscopy. United States.
Kisielowski, C., and Jinschek, J.R. Wed . "On the feasibility to investigate point defects by advanced electron microscopy". United States. https://www.osti.gov/servlets/purl/808947.
@article{osti_808947,
title = {On the feasibility to investigate point defects by advanced electron microscopy},
author = {Kisielowski, C. and Jinschek, J.R.},
abstractNote = {Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced electron microscopes, it is feasible to promote experiments that aim to detect single atoms. This enables local investigations of non-stoichiometry. This paper reviews the current state-of-the-art.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2002},
month = {10}
}

Conference:
Other availability
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