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Title: Beam position monitor

Patent Application ·
OSTI ID:808128

An apparatus for determining the position of an x-ray beam relative to a desired beam axis where the apparatus is positioned along the beam path so that a thin metal foil target intersects the x-ray beam generating fluorescent radiation. A PIN diode array is positioned so that a portion of the fluorescent radiation is intercepted by the array resulting in a series of electrical signals from the PIN diodes making up the array. The signals are then analyzed and the position of the x-ray beam is determined relative to the desired beam path.

Research Organization:
Argonne National Lab., IL (US)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
W-31109-ENG-38
Assignee:
DOEGC
Patent Number(s):
PATENTS-US-A9665958
Application Number:
9-665,958; TRN: US200306%%232
OSTI ID:
808128
Resource Relation:
Patent File Date: 2000 Sep 21; Other Information: PBD: 21 Sep 2000
Country of Publication:
United States
Language:
English