DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS

Conference · Thu Aug 01 00:00:00 EDT 2002

OSTI ID:804729

GROTH, M; FENSTERMACHER, M E; LASNIER, C J; HERNANDEZ, R; MOELLER, J M; STURZ, R A

The tangentially viewing visible and vertically viewing infrared cameras systems on DIII-D were upgraded to permit emission measurements during edge localized modes (ELMs) with integration times as short as 1 and 100 {micro}s respectively. The visible system was used to obtain 2-D poloidal profiles of CIII (465 nm) and D{sub {alpha}} (656.3 nm) emission with 20 {micro}s integration during various stages of ELM events in the lower DIII-D divertor. The infrared (IR) system was used to measure the heat flux to the divertor targets at 10 kHz with 100 {micro}s exposure. Upgrades to the data processing and storage systems permitted efficient comparison of the temporal evolution of these measurements.

• Research Organization: General Atomics, San Diego, CA (United States)
• Sponsoring Organization: (US)
• DOE Contract Number: AC03-99ER54463
• OSTI ID: 804729
• Resource Relation: Conference: Fourteenth Topical Conference on High Temperature Plasma Diagnostics, Madison, WI (US), 07/08/2002--07/11/2002; Other Information: This is a preprint of a paper to be presented at the Fourteenth Topical Conference on High Temperature Plasma Diagnostics, July 8-11, 2002, Madison, Wisconsin, and to be published in the Proceedings.; PBD: 1 Aug 2002
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
CAMERAS
DATA PROCESSING
DIAGNOSIS
DIVERTORS
DOUBLET-3 DEVICE
EDGE LOCALIZED MODES
HEAT FLUX
PLASMA DIAGNOSTICS
STORAGE
TARGETS