DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
Conference
·
OSTI ID:804726
A261. DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
- Research Organization:
- General Atomics, San Diego, CA (United States)
- Sponsoring Organization:
- (US)
- DOE Contract Number:
- AC03-99ER54463
- OSTI ID:
- 804726
- Resource Relation:
- Conference: 14th Topical Conference on High Temperature Plasma Diagnostics, Madison, WI (US), 07/08/2002--07/11/2002; Other Information: THIS IS A PREPRINT OF A PAPER TO BE PRESENTED AT THE 14TH TOPICAL CONFERENCE ON HIGH TEMPERATURE PLASMA DIAGNOSTICS, JULY 8-11, 2002, MADISON, WISCONSIN, AND TO BE PUBLISHED IN THE ''PROCEEDINGS''; PBD: 1 Aug 2002
- Country of Publication:
- United States
- Language:
- English
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DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
Conference
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Thu Aug 01 00:00:00 EDT 2002
·
OSTI ID:804726
+3 more
DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
Conference
·
Thu Aug 01 00:00:00 EDT 2002
·
OSTI ID:804726
+3 more
DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
Conference
·
Thu Aug 01 00:00:00 EDT 2002
·
OSTI ID:804726
+3 more