Constant-pressure specific heat to hemispherical total emissivity ratio for undercooled liquid nickel, zirconium, and silicon
- Jet Propulsion Lab., Pasadena, CA (United States)
Radiative cooling curves of nickel, zirconium, and silicon melts that were obtained using the high-temperature, high-vacuum electrostatic levitator (HTHVESL) have been analyzed to determine the ratio between the constant-pressure specific heat and the hemispherical total emissivity, c{sub p}(T)/{var_epsilon}{sub T}(T). This ratio determined over a wide liquid temperature range for each material allows one to determine c{sub p}(T) if {var_epsilon}{sub T}(T) is known or vice versa. Following the recipe, the hemispherical total emissivities for each sample at its melting temperature, {var_epsilon}{sub T}(T{sub m}), have been determined using c{sub p}(T{sub m}) values available in the literature. They are 0.15, 0.29, and 0.17, for Ni, Zr, and Si, respectively.
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 80022
- Journal Information:
- Metallurgical Transactions, B, Vol. 26, Issue 3; Other Information: PBD: Jun 1995
- Country of Publication:
- United States
- Language:
- English
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