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Title: Bulk band gaps in divalent hexaborides: A soft x-ray emission study

Abstract

Boron K-edge soft x-ray emission and absorption are used to address the fundamental question of whether divalent hexaborides are intrinsic semimetals or defect-doped bandgap insulators. These bulk sensitive measurements, complementary and consistent with surface-sensitive angle-resolved photoemission experiments, confirm the existence of a bulk band gap and the location of the chemical potential at the bottom of the conduction band.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Director, Office of Science. Office of Basic Energy Studies. Materials Science and Engineering Division (US)
OSTI Identifier:
797838
Report Number(s):
LBNL-49193
R&D Project: A58082; B& R KC0204016; TRN: US0202040
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Conference
Resource Relation:
Conference: XIII International Conference on Vacuum Ultraviolet Radiation Physics, VUV-13, Trieste (IT), 07/23/2001--07/27/2001; Other Information: PBD: 3 Oct 2001
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION; BORON; FAR ULTRAVIOLET RADIATION; PHOTOEMISSION; PHYSICS; SEMIMETALS; DIVALENT HEXABORIDE SOFT X-RAY EMISSION SEMICONDUCTOR

Citation Formats

Denlinger, Jonathan D., Gweon, Gey-Hong, Allen, James W., Bianchi, Andrea D., and Fisk, Zachary. Bulk band gaps in divalent hexaborides: A soft x-ray emission study. United States: N. p., 2001. Web.
Denlinger, Jonathan D., Gweon, Gey-Hong, Allen, James W., Bianchi, Andrea D., & Fisk, Zachary. Bulk band gaps in divalent hexaborides: A soft x-ray emission study. United States.
Denlinger, Jonathan D., Gweon, Gey-Hong, Allen, James W., Bianchi, Andrea D., and Fisk, Zachary. Wed . "Bulk band gaps in divalent hexaborides: A soft x-ray emission study". United States. doi:. https://www.osti.gov/servlets/purl/797838.
@article{osti_797838,
title = {Bulk band gaps in divalent hexaborides: A soft x-ray emission study},
author = {Denlinger, Jonathan D. and Gweon, Gey-Hong and Allen, James W. and Bianchi, Andrea D. and Fisk, Zachary},
abstractNote = {Boron K-edge soft x-ray emission and absorption are used to address the fundamental question of whether divalent hexaborides are intrinsic semimetals or defect-doped bandgap insulators. These bulk sensitive measurements, complementary and consistent with surface-sensitive angle-resolved photoemission experiments, confirm the existence of a bulk band gap and the location of the chemical potential at the bottom of the conduction band.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Oct 03 00:00:00 EDT 2001},
month = {Wed Oct 03 00:00:00 EDT 2001}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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