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Title: Synchrotron-based impurity mapping

Abstract

No abstract prepared.

Authors:
; ;
Publication Date:
Research Org.:
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, CA (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
797176
Report Number(s):
LBNL/ALS-29607
TRN: US0204026
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Conference
Resource Relation:
Conference: 8th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, Narita (JP), 09/15/1999--09/18/1999; Other Information: PBD: 1 Sep 1999
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; ADVANCED LIGHT SOURCE; PHYSICS; SYNCHROTRONS; MAPPING; ADVANCED LIGHT SOURCE ALS

Citation Formats

McHugo, Scott, Thompson, Albert C., and Lamble, G. Synchrotron-based impurity mapping. United States: N. p., 1999. Web.
McHugo, Scott, Thompson, Albert C., & Lamble, G. Synchrotron-based impurity mapping. United States.
McHugo, Scott, Thompson, Albert C., and Lamble, G. Wed . "Synchrotron-based impurity mapping". United States.
@article{osti_797176,
title = {Synchrotron-based impurity mapping},
author = {McHugo, Scott and Thompson, Albert C. and Lamble, G.},
abstractNote = {No abstract prepared.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {9}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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