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Title: Radiation dose measurements of the insertion devices

Abstract

No abstract prepared.

Authors:
;
Publication Date:
Research Org.:
Argonne National Lab., IL (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
795067
Report Number(s):
LS-283 ADDENDUM 2
TRN: US0201283
DOE Contract Number:
W-31-109-ENG-38
Resource Type:
Technical Report
Resource Relation:
Other Information: PBD: 28 Feb 2002
Country of Publication:
United States
Language:
English
Subject:
61 RADIATION PROTECTION AND DOSIMETRY; RADIATION DOSES; RADIATION MONITORING; ANL

Citation Formats

Alderman, J, and Job, P. K.. Radiation dose measurements of the insertion devices. United States: N. p., 2002. Web. doi:10.2172/795067.
Alderman, J, & Job, P. K.. Radiation dose measurements of the insertion devices. United States. doi:10.2172/795067.
Alderman, J, and Job, P. K.. Thu . "Radiation dose measurements of the insertion devices". United States. doi:10.2172/795067. https://www.osti.gov/servlets/purl/795067.
@article{osti_795067,
title = {Radiation dose measurements of the insertion devices},
author = {Alderman, J and Job, P. K.},
abstractNote = {No abstract prepared.},
doi = {10.2172/795067},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Feb 28 00:00:00 EST 2002},
month = {Thu Feb 28 00:00:00 EST 2002}
}

Technical Report:

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  • The Advanced Photon Source (APS) uses Nd-Fe-B permanent magnets in the insertion devices to produce x-rays for scientific research. Earlier investigations have exhibited varying degrees of demagnetization of these magnets due to irradiation from electron beams, {sup 60}Co {gamma}-rays, and high-energy neutrons. Although no detectable radiation-induced demagnetization has been observed in the APS insertion devices so far, partial demagnetization has been observed in at lest one insertion device at the European Synchrotron Radiation Facility (ESRF), where Nd-Fe-B permanent magnets are also used. A growing concern for the APS insertion devices, as well as the permanent magnets that will be usedmore » in next generation high-power light sources, like the FEL, resulted from the partial demagnetization observed in the ESRF devices. This concern in relation to radiation-induced demagnetization spurred a long-term project aimed to measure and analyze the total absorbed doses received by the APS insertion devices. The project required a reliable photon high dose dosimetry technique capable of measuring absorbed doses greater than 10{sup 6} rad, which was not readily available at the APS. Through a collaboration with the National Institute of Standards and Technology (NIST), one such technique using radiachromic films was considered, tested, and calibrated at the APS. This consequently led to the implementation of radiachromic films as the technique of choice for measuring the total absorbed doses received by the insertion devices for each of the APS runs.« less
  • Results of radiation dose measurements of the insertion devices for the year 2000 have been added as Figures 29-35.
  • The Advanced Photon Source (APS) uses Nd-Fe-B permanent magnets in the insertion devices to produce x-rays for scientific research [1,2]. Earlier investigations have exhibited varying degrees of demagnetization of these magnets [3] due to irradiation from electron beams [4,5,6], {sup 60}Co {gamma}-rays [5], and high-energy neutrons [7,8]. Radiation-induced demagnetization has been observed in the APS insertion devices [9] and was first measured in December of 2001. Partial demagnetization has also been observed in insertion devices at the European Synchrotron Radiation Facility (ESRF) [4,6], where Nd-Fe-B permanent magnets are also used. Growing concern for the lifetime of APS insertion devices, asmore » well as the permanent magnets that will be used in next-generation, high-power light sources, like the FEL [10,11], resulted from the partial demagnetization observations made at both facilities. This concern in relation to radiation-induced demagnetization spurred a long-term project to measure and analyze the absorbed doses received by the APS insertion devices. The project required a reliable photon high-dose dosimetry technique capable of measuring absorbed doses greater than 10{sup 6} rad, which was not readily available at the APS. Through a collaboration with the National Institute of Standards and Technology (NIST), one such technique using radiachromic films was considered, tested, and calibrated at the APS. This consequently led to the implementation of radiachromic film dosimetry for measuring the absorbed doses received by the insertion devices for each of the APS runs.« less
  • This document provides steady-state, total-dose radiation-test data, in graphic format, for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. The document is in two volumes. Volume I provides data on diodes, bipolar transistors, field effect transistors, and miscellaneous semiconductor types. Volume II provides data on integrated circuits.
  • This document is part two of a three-volume set. Volume I provides total ionizing-dose radiation-test data on diodes, bipolar transistors, field-effect transistors, and miscellaneous discrete solid-state devices. Volume II provides similar data on integrated circuits. Volume III provides a detailed analysis of the data from Volumes I and II. Volume III will be released during 1982. The data presented here are presented in graphic, tabular, or narrative format, depending on the complexity of the integrated circuit. Most of the tests were done using the JPL or Boeing electron accelerator (Dynamitron) that provides a steady-state 2.5-MeV electron beam. However, some radiationmore » exposures were made with a Cobalt-60 gamma ray source. The results obtained with the Cobalt-60 source should be regarded as only an approximate measure of the radiation damage that would be incurred by an equivalent dose of electrons. All data were generated in support of NASA space programs by the JPL Radiation Effects and Testing Group (514).« less