Characterization of buried thin films with resonant soft x-ray fluorescence (printed title is: Characterizing Buried Interfaces Using Resonant Soft X-Ray Fluorescence)
No abstract prepared.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 794480
- Report Number(s):
- LBL-36946; LBNL/ALS-171; APPLAB; TRN: US0203368
- Journal Information:
- Applied Physics Letters, Vol. 67, Issue 1; Other Information: Journal Publication Date: July 3 1995; PBD: 1 Mar 1995; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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