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Title: X-ray photoemission electron microscopy, a tool for the investigation of complex magnetic structures.

Abstract

X-ray Photoemission Electron Microscopy unites the chemical specificity and magnetic sensitivity of soft x-ray absorption techniques with the high spatial resolution of electron microscopy. The discussed instrument possesses a spatial resolution of better than 50 nm and is located at a bending magnet beamline at the Advanced Light Source, providing linearly and circularly polarized radiation between 250 and 1300 eV. We will present examples which demonstrate the power of this technique applied to problems in the field of thin film magnetism. The chemical and elemental specificity is of particular importance for the study of magnetic exchange coupling because it allows separating the signal of the different layers and interfaces in complex multi-layered structures.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab., CA (US)
Sponsoring Org.:
USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (US)
OSTI Identifier:
787169
Report Number(s):
LBNL-48852; LBNL/ALS-43825
R&D Project: A58128; TRN: US200305%%931
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Conference
Resource Relation:
Conference: SRI 2001, Madison, WI (US), 08/21/2001--08/24/2001; Other Information: Supercedes report DE00787169; PBD: 30 Aug 2001;Review of Scientific Instruments, Vol. 73, No. 3, pp. 1362-1366, March 2002; PBD: 30 Aug 2001
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ABSORPTION; ADVANCED LIGHT SOURCE; BENDING; ELECTRON MICROSCOPY; MAGNETISM; MAGNETS; PHOTOEMISSION; RADIATIONS; SENSITIVITY; SPATIAL RESOLUTION; SPECIFICITY; THIN FILMS

Citation Formats

Scholl, Andreas, Ohldag, Hendrik, Nolting, Frithjof, Stohr, Joachim, and Padmore, Howard A. X-ray photoemission electron microscopy, a tool for the investigation of complex magnetic structures.. United States: N. p., 2001. Web.
Scholl, Andreas, Ohldag, Hendrik, Nolting, Frithjof, Stohr, Joachim, & Padmore, Howard A. X-ray photoemission electron microscopy, a tool for the investigation of complex magnetic structures.. United States.
Scholl, Andreas, Ohldag, Hendrik, Nolting, Frithjof, Stohr, Joachim, and Padmore, Howard A. Thu . "X-ray photoemission electron microscopy, a tool for the investigation of complex magnetic structures.". United States. https://www.osti.gov/servlets/purl/787169.
@article{osti_787169,
title = {X-ray photoemission electron microscopy, a tool for the investigation of complex magnetic structures.},
author = {Scholl, Andreas and Ohldag, Hendrik and Nolting, Frithjof and Stohr, Joachim and Padmore, Howard A.},
abstractNote = {X-ray Photoemission Electron Microscopy unites the chemical specificity and magnetic sensitivity of soft x-ray absorption techniques with the high spatial resolution of electron microscopy. The discussed instrument possesses a spatial resolution of better than 50 nm and is located at a bending magnet beamline at the Advanced Light Source, providing linearly and circularly polarized radiation between 250 and 1300 eV. We will present examples which demonstrate the power of this technique applied to problems in the field of thin film magnetism. The chemical and elemental specificity is of particular importance for the study of magnetic exchange coupling because it allows separating the signal of the different layers and interfaces in complex multi-layered structures.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2001},
month = {8}
}

Conference:
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