A High Resolution Sub-Micron Retarding Field Energy Analyzer for Low Temperature Plasma Analysis

Journal Article · Tue Jun 15 00:00:00 EDT 1999 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.125495· OSTI ID:7865

Blain, M G; Stevens, J E; Woodworth, J R

A retarding potential energy analyzer having 750 nm diameter, self-aligned grid apertures and micron scale grid separation has been fabricated using polycrystalline silicon and silicon dioxide. High resolution in situ measurements of ion velocity distributions have been demonstrated in inductively coupled argon plasmas. Measurement results agree well with those from a macroscopic analyzer. Important differences are observed in the energies of plasma ions when measured with respect to chamber wall versus those measured with respect to the plasma floating potential. Preliminary measurements under rf bias conditions have also been made and results follow the expected trends.

• Research Organization: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 7865
• Report Number(s): SAND99-1509J; ON: DE00007865
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
Electrostatic Analyzers
Plasma
Silicon
Silicon Oxides
Electric Potential