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Title: ELECTRON BUNCH CHARACTERIZATION WITH SUBPICOSECOND RESOLUTION USING ELECTRO-OPTIC TECHNIQUE.

Abstract

In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically and are in the range off a few millimeters. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions. One of the techniques uses the electric field induced by the passage of electrons in the vicinity of a birefringent crystal to change its optical characteristics. Well-established electro-optic techniques can then be used to measure the temporal characteristics of the electron bunch. The inherent fast response of the crystal facilitates the measurement to femtosecond time resolution. However, the resolution in experiments so far has been limited to 70 ps, by the bandwidth of the detection equipment. Use of a streak camera can improve this resolution to a few picoseconds. In this paper we present a novel, non-invasive, single-shot approach to improve the resolution to tens of femtoseconds so that sub mm bunch length can be measured.

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Lab., Upton, NY (US)
Sponsoring Org.:
USDOE Office of Energy Research (ER) (US)
OSTI Identifier:
782052
Report Number(s):
BNL-68364; KA04030000
R&D Project: LS02; KA04030000; TRN: US0103092
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Conference
Resource Relation:
Conference: BEAM DYNAMICS WORKSHOP ON LASER BEAM INTERACTION, STONY BROOK, NY (US), 06/11/2001--06/15/2001; Other Information: PBD: 11 Jun 2001
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; ACCELERATORS; DETECTION; ELECTRON BEAMS; STREAK CAMERAS; TIME RESOLUTION; BEAM BUNCHING

Citation Formats

SEMERTZIDIS, Y K, CASTILLO, V, LARSEN, R, LAZARUS, D M, NIKAS, D, OZBEN, C, SRINIVASAN-RAO, T, STILLMAN, A, TSANG, T, and KOWALSKI, L. ELECTRON BUNCH CHARACTERIZATION WITH SUBPICOSECOND RESOLUTION USING ELECTRO-OPTIC TECHNIQUE.. United States: N. p., 2001. Web.
SEMERTZIDIS, Y K, CASTILLO, V, LARSEN, R, LAZARUS, D M, NIKAS, D, OZBEN, C, SRINIVASAN-RAO, T, STILLMAN, A, TSANG, T, & KOWALSKI, L. ELECTRON BUNCH CHARACTERIZATION WITH SUBPICOSECOND RESOLUTION USING ELECTRO-OPTIC TECHNIQUE.. United States.
SEMERTZIDIS, Y K, CASTILLO, V, LARSEN, R, LAZARUS, D M, NIKAS, D, OZBEN, C, SRINIVASAN-RAO, T, STILLMAN, A, TSANG, T, and KOWALSKI, L. Mon . "ELECTRON BUNCH CHARACTERIZATION WITH SUBPICOSECOND RESOLUTION USING ELECTRO-OPTIC TECHNIQUE.". United States. https://www.osti.gov/servlets/purl/782052.
@article{osti_782052,
title = {ELECTRON BUNCH CHARACTERIZATION WITH SUBPICOSECOND RESOLUTION USING ELECTRO-OPTIC TECHNIQUE.},
author = {SEMERTZIDIS, Y K and CASTILLO, V and LARSEN, R and LAZARUS, D M and NIKAS, D and OZBEN, C and SRINIVASAN-RAO, T and STILLMAN, A and TSANG, T and KOWALSKI, L},
abstractNote = {In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically and are in the range off a few millimeters. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions. One of the techniques uses the electric field induced by the passage of electrons in the vicinity of a birefringent crystal to change its optical characteristics. Well-established electro-optic techniques can then be used to measure the temporal characteristics of the electron bunch. The inherent fast response of the crystal facilitates the measurement to femtosecond time resolution. However, the resolution in experiments so far has been limited to 70 ps, by the bandwidth of the detection equipment. Use of a streak camera can improve this resolution to a few picoseconds. In this paper we present a novel, non-invasive, single-shot approach to improve the resolution to tens of femtoseconds so that sub mm bunch length can be measured.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2001},
month = {6}
}

Conference:
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