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Title: SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.

Abstract

No abstract prepared.

Authors:
Publication Date:
Research Org.:
Brookhaven National Lab., Upton, NY (US)
Sponsoring Org.:
USDOE Office of Energy Research (ER) (US)
OSTI Identifier:
767102
Report Number(s):
BNL-67638; KA0403000
R&D Project: LS2; KA0403000; TRN: AH200037%%222
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Conference
Resource Relation:
Conference: BEAM INSTRUMENTATION WORKSHOP 2000, CAMBRIDGE, MA (US), 05/08/2000--05/12/2000; Other Information: PBD: 8 May 2000
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; ELECTRON BEAMS; FREE ELECTRON LASERS; DIAGNOSTIC TECHNIQUES; BEAM DYNAMICS

Citation Formats

WANG,X.J. SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.. United States: N. p., 2000. Web.
WANG,X.J. SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.. United States.
WANG,X.J. Mon . "SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.". United States. https://www.osti.gov/servlets/purl/767102.
@article{osti_767102,
title = {SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.},
author = {WANG,X.J.},
abstractNote = {No abstract prepared.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2000},
month = {5}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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