skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Submicron X-ray diffraction

Abstract

At the Advanced Light Source in Berkeley the authors have instrumented a beam line that is devoted exclusively to x-ray micro diffraction problems. By micro diffraction they mean those classes of problems in Physics and Materials Science that require x-ray beam sizes in the sub-micron range. The instrument is for instance, capable of probing a sub-micron size volume inside micron sized aluminum metal grains buried under a silicon dioxide insulating layer. The resulting Laue pattern is collected on a large area CCD detector and automatically indexed to yield the grain orientation and deviatoric (distortional) strain tensor of this sub-micron volume. A four-crystal monochromator is then inserted into the beam, which allows monochromatic light to illuminate the same part of the sample. Measurement of diffracted photon energy allows for the determination of d spacings. The combination of white and monochromatic beam measurements allow for the determination of the total strain/stress tensor (6 components) inside each sub-micron sized illuminated volume of the sample.

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (US)
OSTI Identifier:
764370
Report Number(s):
LBNL-45241
R&D Project: 458080; TRN: US0005000
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Conference
Resource Relation:
Conference: Synchrotron Radiation Instrumentation 2000, Berlin (DE), 08/21/2000--08/25/2000; Other Information: PBD: 17 Aug 2000
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; ADVANCED LIGHT SOURCE; ALUMINIUM; BEAMS; GRAIN ORIENTATION; PHOTONS; STRAINS; SYNCHROTRON RADIATION; TENSORS; X-RAY DIFFRACTION; MICROANALYSIS; X-RAY MICRO-DIFFRACTION ELECTROMIGRATION FOCUSING

Citation Formats

MacDowell, Alastair, Celestre, Richard, Tamura, Nobumichi, Spolenak, Ralph, Valek, Bryan, Brown, Walter, Bravman, John, Padmore, Howard, Batterman, Boris, and Patel, Jamshed. Submicron X-ray diffraction. United States: N. p., 2000. Web.
MacDowell, Alastair, Celestre, Richard, Tamura, Nobumichi, Spolenak, Ralph, Valek, Bryan, Brown, Walter, Bravman, John, Padmore, Howard, Batterman, Boris, & Patel, Jamshed. Submicron X-ray diffraction. United States.
MacDowell, Alastair, Celestre, Richard, Tamura, Nobumichi, Spolenak, Ralph, Valek, Bryan, Brown, Walter, Bravman, John, Padmore, Howard, Batterman, Boris, and Patel, Jamshed. Thu . "Submicron X-ray diffraction". United States. https://www.osti.gov/servlets/purl/764370.
@article{osti_764370,
title = {Submicron X-ray diffraction},
author = {MacDowell, Alastair and Celestre, Richard and Tamura, Nobumichi and Spolenak, Ralph and Valek, Bryan and Brown, Walter and Bravman, John and Padmore, Howard and Batterman, Boris and Patel, Jamshed},
abstractNote = {At the Advanced Light Source in Berkeley the authors have instrumented a beam line that is devoted exclusively to x-ray micro diffraction problems. By micro diffraction they mean those classes of problems in Physics and Materials Science that require x-ray beam sizes in the sub-micron range. The instrument is for instance, capable of probing a sub-micron size volume inside micron sized aluminum metal grains buried under a silicon dioxide insulating layer. The resulting Laue pattern is collected on a large area CCD detector and automatically indexed to yield the grain orientation and deviatoric (distortional) strain tensor of this sub-micron volume. A four-crystal monochromator is then inserted into the beam, which allows monochromatic light to illuminate the same part of the sample. Measurement of diffracted photon energy allows for the determination of d spacings. The combination of white and monochromatic beam measurements allow for the determination of the total strain/stress tensor (6 components) inside each sub-micron sized illuminated volume of the sample.},
doi = {},
url = {https://www.osti.gov/biblio/764370}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2000},
month = {8}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: