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Title: Effects of Intensity and Position Modulation On Switched Electrode Electronics Beam Position Monitor Systems at Jefferson Lab

Abstract

Two types of switched electrode electronics beam position monitors are in use at Jefferson Lab. Together they provide accurate beam position to the control system for beam intensities between 50 nA and 2 mA. One version, called the linac style, has a switching frequency of 125 kHz. The other, called the transport type, has a switching frequency of 7 kHz. The basic system provides information to the control system at a 1 Hz update rate. The systems are regularly used to measure the AC component of beam position and energy as well as suppress this motion as part of a fast feedback system. Position data produced by the system are also acquired on an event by event basis as part of the nuclear physics program in two of the experimental halls. This paper will focus on the AC characteristics of the system. These characteristics are affected by analog filter frequencies and a time delay between the measurement of the positive electrode signal and the negative electrode signal. The errors introduced by position and intensity modulation on the measured beam characteristics will also be discussed.

Authors:
Publication Date:
Research Org.:
Thomas Jefferson National Accelerator Facility, Newport News, VA (US)
Sponsoring Org.:
USDOE Office of Energy Research (ER) (US)
OSTI Identifier:
760443
Report Number(s):
JLAB-ACT-00-09; DOE/ER/40150-1744
TRN: US0004370
DOE Contract Number:  
AC05-84ER40150
Resource Type:
Conference
Resource Relation:
Conference: Beam Instrumentation Workshop, Cambridge, MA (US), 05/11/2000; Other Information: PBD: 1 May 2000
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; BEAM POSITION; CONTROL SYSTEMS; ELECTRODES; SWITCHING CIRCUITS; CEBAF ACCELERATOR; FREQUENCY MODULATION; MONITORS

Citation Formats

Tom Powers. Effects of Intensity and Position Modulation On Switched Electrode Electronics Beam Position Monitor Systems at Jefferson Lab. United States: N. p., 2000. Web.
Tom Powers. Effects of Intensity and Position Modulation On Switched Electrode Electronics Beam Position Monitor Systems at Jefferson Lab. United States.
Tom Powers. Mon . "Effects of Intensity and Position Modulation On Switched Electrode Electronics Beam Position Monitor Systems at Jefferson Lab". United States. https://www.osti.gov/servlets/purl/760443.
@article{osti_760443,
title = {Effects of Intensity and Position Modulation On Switched Electrode Electronics Beam Position Monitor Systems at Jefferson Lab},
author = {Tom Powers},
abstractNote = {Two types of switched electrode electronics beam position monitors are in use at Jefferson Lab. Together they provide accurate beam position to the control system for beam intensities between 50 nA and 2 mA. One version, called the linac style, has a switching frequency of 125 kHz. The other, called the transport type, has a switching frequency of 7 kHz. The basic system provides information to the control system at a 1 Hz update rate. The systems are regularly used to measure the AC component of beam position and energy as well as suppress this motion as part of a fast feedback system. Position data produced by the system are also acquired on an event by event basis as part of the nuclear physics program in two of the experimental halls. This paper will focus on the AC characteristics of the system. These characteristics are affected by analog filter frequencies and a time delay between the measurement of the positive electrode signal and the negative electrode signal. The errors introduced by position and intensity modulation on the measured beam characteristics will also be discussed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2000},
month = {5}
}

Conference:
Other availability
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