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Title: Two Applications of Direct Digital Down Converters in Beam Diagnostics

Conference ·
DOI:https://doi.org/10.1063/1.1342596· OSTI ID:760440

The technologies of direct digital down converters, digital frequency synthesis, and digital signal processing are being used in many commercial applications. Because of this commercialization, the component costs are being reduced to the point where they are economically viable for large scale accelerator applications. This paper will discuss two applications of these technologies to beam diagnostics. In the first application the combination of direct digital frequency synthesis and direct digital down converters are coupled with digital signal processor technology in order to maintain the stable gain environment required for a multi-electrode beam position monitoring system. This is done by injecting a CW reference signal into the electronics as part of the front-end circuitry. In the second application direct digital down converters are used to provide a novel approach to the measurement of beam intensity using cavity current monitors. In this system a pair of reference signals are injected into the cavity through an auxiliary port. The beam current is then calculated as the ratio of the beam signal divided by the average of the magnitude of the two reference signals.

Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Energy Research (ER) (US)
DOE Contract Number:
AC05-84ER40150
OSTI ID:
760440
Report Number(s):
JLAB-ACT-00-07; DOE/ER/40150-1743; TRN: US0004369
Resource Relation:
Journal Volume: 546; Conference: Beam Instrumentation Workshop, Cambridge, MA (US), 05/11/2000; Other Information: PBD: 1 May 2000
Country of Publication:
United States
Language:
English

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