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Title: Interfacial force microscopy: Application to polymer surfaces

Abstract

Scanning-probe microscopies (SPM) are presently widely used in remarkably diverse applications and, as evidenced by this symposium these techniques are rapidly expanding into the important areas of polymer surfaces and interfaces. The Atomic Force Microscope (AFM) is presently the most widely used of the scanning-probe techniques. However, the AFM's range of application suffers from an inherent mechanical instability in its deflection force sensor. The instability problem has been overcome by the development of the Interfacial Force Microscope (IFM), which utilizes a force-feedback sensor concept. In the following, the authors present several examples of polymer applications to illustrate the utility of the IFM sensor concept.

Authors:
;
Publication Date:
Research Org.:
Sandia National Labs., Albuquerque, NM (US); Sandia National Labs., Livermore, CA (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
755612
Report Number(s):
SAND2000-1230J
TRN: AH200021%%53
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Journal Article
Journal Name:
Polymer Preprints
Additional Journal Information:
Other Information: Submitted to Polymer Preprints 2000, 41(2); PBD: 16 May 2000
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ATOMIC FORCE MICROSCOPY; MODIFICATIONS; PERFORMANCE; POLYMERS; SURFACE PROPERTIES

Citation Formats

HOUSTON,JACK E., and WINTER,R.M. Interfacial force microscopy: Application to polymer surfaces. United States: N. p., 2000. Web.
HOUSTON,JACK E., & WINTER,R.M. Interfacial force microscopy: Application to polymer surfaces. United States.
HOUSTON,JACK E., and WINTER,R.M. Tue . "Interfacial force microscopy: Application to polymer surfaces". United States. https://www.osti.gov/servlets/purl/755612.
@article{osti_755612,
title = {Interfacial force microscopy: Application to polymer surfaces},
author = {HOUSTON,JACK E. and WINTER,R.M.},
abstractNote = {Scanning-probe microscopies (SPM) are presently widely used in remarkably diverse applications and, as evidenced by this symposium these techniques are rapidly expanding into the important areas of polymer surfaces and interfaces. The Atomic Force Microscope (AFM) is presently the most widely used of the scanning-probe techniques. However, the AFM's range of application suffers from an inherent mechanical instability in its deflection force sensor. The instability problem has been overcome by the development of the Interfacial Force Microscope (IFM), which utilizes a force-feedback sensor concept. In the following, the authors present several examples of polymer applications to illustrate the utility of the IFM sensor concept.},
doi = {},
journal = {Polymer Preprints},
number = ,
volume = ,
place = {United States},
year = {2000},
month = {5}
}