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Title: Characterization of electrical resistivity as a function of temperature in the Mo-Si-B system

Abstract

Measurements of electrical resistivity as a function of temperature from 25 to 1,500 C were conducted on polycrystalline samples in the Mo-Si-B system. Single phase, or nearly single phase, samples were prepared for the following phases: Mo 3Si, Mo 5SiB 2, Mo 5Si 3B x, MoB, MoSi 2, and Mo 5Si 3. Thesis materials all exhibit resistivity values within a narrow range(4--22 x 10 -7Ω-m), and the low magnitude suggests these materials are semi-metals or low density of states metals. With the exception of MoSi 2, all single phase materials in this study were also found to have low temperature coefficient of resistivity(TCR) values. These values ranged from 2.10 x 10 -10 to 4.74 x 10 -10Ω-m/° C, and MoSi 2 had a TCR of 13.77 x 10 -10Ω-m/° C. The results from the single phase sample measurements were employed in a natural log rule-of-mixtures model to relate the individual phase resistivity values to those of multiphase composites. Three Mo-Si-B phase regions were analyzed: the binary Mo 5Si 3-MoSi 2 system, the ternary phase field Mo 5Si 3B xMoB-MoSi 2, and the Mo 3Si-Mo 5SiB 2-Mo 5Si 3B x ternary region. The experimental data for samples in each of thesemore » regions agreed with the natural log model and illustrated that this model can predict the electrical resistivity as a function of temperature of multi-phase, sintered samples within an error of one standard deviation.« less

Authors:
 [1]
  1. Iowa State Univ., Ames, IA (United States)
Publication Date:
Research Org.:
Ames Lab., Ames, IA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
754786
Report Number(s):
IS-T-1889
TRN: US0003551
DOE Contract Number:  
W-7405-ENG-82
Resource Type:
Thesis/Dissertation
Resource Relation:
Other Information: TH: Thesis (M.S.); Submitted to Iowa State Univ., Ames, IA (US); PBD: 10 Dec 1999
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ELECTRIC CONDUCTIVITY; TEMPERATURE DEPENDENCE; MOLYBDENUM SILICIDES; MOLYBDENUM BORIDES; MATHEMATICAL MODELS

Citation Formats

Beckman, Sarah E. Characterization of electrical resistivity as a function of temperature in the Mo-Si-B system. United States: N. p., 1999. Web. doi:10.2172/754786.
Beckman, Sarah E. Characterization of electrical resistivity as a function of temperature in the Mo-Si-B system. United States. doi:10.2172/754786.
Beckman, Sarah E. Fri . "Characterization of electrical resistivity as a function of temperature in the Mo-Si-B system". United States. doi:10.2172/754786. https://www.osti.gov/servlets/purl/754786.
@article{osti_754786,
title = {Characterization of electrical resistivity as a function of temperature in the Mo-Si-B system},
author = {Beckman, Sarah E.},
abstractNote = {Measurements of electrical resistivity as a function of temperature from 25 to 1,500 C were conducted on polycrystalline samples in the Mo-Si-B system. Single phase, or nearly single phase, samples were prepared for the following phases: Mo3Si, Mo5SiB2, Mo5Si3Bx, MoB, MoSi2, and Mo5Si3. Thesis materials all exhibit resistivity values within a narrow range(4--22 x 10-7Ω-m), and the low magnitude suggests these materials are semi-metals or low density of states metals. With the exception of MoSi2, all single phase materials in this study were also found to have low temperature coefficient of resistivity(TCR) values. These values ranged from 2.10 x 10-10 to 4.74 x 10-10Ω-m/° C, and MoSi2 had a TCR of 13.77 x 10-10Ω-m/° C. The results from the single phase sample measurements were employed in a natural log rule-of-mixtures model to relate the individual phase resistivity values to those of multiphase composites. Three Mo-Si-B phase regions were analyzed: the binary Mo5Si3-MoSi2 system, the ternary phase field Mo5Si3BxMoB-MoSi2, and the Mo3Si-Mo5SiB2-Mo5Si3Bx ternary region. The experimental data for samples in each of these regions agreed with the natural log model and illustrated that this model can predict the electrical resistivity as a function of temperature of multi-phase, sintered samples within an error of one standard deviation.},
doi = {10.2172/754786},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Dec 10 00:00:00 EST 1999},
month = {Fri Dec 10 00:00:00 EST 1999}
}

Thesis/Dissertation:
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