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Title: Detection of electron and hole traps in CdZnTe radiation detectors by thermoelectric emission spectroscopy and thermally stimulated conductivity

Abstract

The electrical properties of CdZnTe radiation detectors are largely determined by electron and hole traps in this material. The traps, in addition to degrading the detector performance, can function as dopants and determine the resistivity of the material. Thermoelectric emission spectroscopy and thermally stimulated conductivity are used to detect these traps in a commercially available spectrometer-grade CdZnTe detector, and the electrical resistivity is measured as a function of temperature. A deep electron trap having an energy of 695 meV and cross section of 8 x 10{sup {minus}16}cm{sup 2} is detected and three hole traps having energies of 70 {+-} 20 meV, 105 {+-} 30 meV and 694 {+-} 162 meV are detected. A simple model based on these traps explains quantitatively all the data, including the electrical properties at room temperature and also their temperature dependence.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Labs., Albuquerque, NM (US); Sandia National Labs., Livermore, CA (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
751150
Report Number(s):
SAND98-8600C
TRN: US0003473
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: SPIE Proceedings of Hard X-ray and Gamma-Ray Detector Physics and Applications, San Diego, CA (US), 07/19/1998--07/22/1998; Other Information: PBD: 18 Jun 1998
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; X-RAY SPECTROMETERS; GAMMA SPECTROMETERS; SEMICONDUCTOR DETECTORS; CADMIUM TELLURIDES; ZINC TELLURIDES; TRAPS; ELECTRIC CONDUCTIVITY; TEMPERATURE DEPENDENCE

Citation Formats

E. Y. Lee, B. A. Brunett, R. W. Olsen, J. M. Van Scyoc III, H. Hermon, and R. B. James. Detection of electron and hole traps in CdZnTe radiation detectors by thermoelectric emission spectroscopy and thermally stimulated conductivity. United States: N. p., 1998. Web.
E. Y. Lee, B. A. Brunett, R. W. Olsen, J. M. Van Scyoc III, H. Hermon, & R. B. James. Detection of electron and hole traps in CdZnTe radiation detectors by thermoelectric emission spectroscopy and thermally stimulated conductivity. United States.
E. Y. Lee, B. A. Brunett, R. W. Olsen, J. M. Van Scyoc III, H. Hermon, and R. B. James. Thu . "Detection of electron and hole traps in CdZnTe radiation detectors by thermoelectric emission spectroscopy and thermally stimulated conductivity". United States. https://www.osti.gov/servlets/purl/751150.
@article{osti_751150,
title = {Detection of electron and hole traps in CdZnTe radiation detectors by thermoelectric emission spectroscopy and thermally stimulated conductivity},
author = {E. Y. Lee and B. A. Brunett and R. W. Olsen and J. M. Van Scyoc III and H. Hermon and R. B. James},
abstractNote = {The electrical properties of CdZnTe radiation detectors are largely determined by electron and hole traps in this material. The traps, in addition to degrading the detector performance, can function as dopants and determine the resistivity of the material. Thermoelectric emission spectroscopy and thermally stimulated conductivity are used to detect these traps in a commercially available spectrometer-grade CdZnTe detector, and the electrical resistivity is measured as a function of temperature. A deep electron trap having an energy of 695 meV and cross section of 8 x 10{sup {minus}16}cm{sup 2} is detected and three hole traps having energies of 70 {+-} 20 meV, 105 {+-} 30 meV and 694 {+-} 162 meV are detected. A simple model based on these traps explains quantitatively all the data, including the electrical properties at room temperature and also their temperature dependence.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {6}
}

Conference:
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