A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler
Abstract
A simple device composed of a modular double-pentaprism system that enables the long trace profiler (LTP) to measure mirrors in nonconventional ways, i.e., in the vertical-downward and sideways positions, has been devised and implemented in the Advanced Photon Source (APS) long trace profiler (LTP II). The systems is very useful in calibrating mirror-bender assemblies. This paper describes the system and gives results of measurements performed with it on a mirror used at the APS.
- Authors:
- Publication Date:
- Research Org.:
- Argonne National Lab., IL (US)
- Sponsoring Org.:
- US Department of Energy (US)
- OSTI Identifier:
- 750600
- Report Number(s):
- ANL/UPD/CP-100563
TRN: US0003514
- DOE Contract Number:
- W-31109-ENG-38
- Resource Type:
- Conference
- Resource Relation:
- Conference: American Institute of Physics, Stanford, CA (US), 10/13/1999--10/15/1999; Other Information: PBD: 22 Nov 1999
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 43 PARTICLE ACCELERATORS; ADVANCED PHOTON SOURCE; ACCELERATOR FACILITIES; MEASURING INSTRUMENTS; MIRRORS; CALIBRATION; OPTICAL SYSTEMS; MEASURING METHODS
Citation Formats
Assoufid, L, and Her, P. A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler. United States: N. p., 1999.
Web.
Assoufid, L, & Her, P. A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler. United States.
Assoufid, L, and Her, P. 1999.
"A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler". United States. https://www.osti.gov/servlets/purl/750600.
@article{osti_750600,
title = {A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler},
author = {Assoufid, L and Her, P},
abstractNote = {A simple device composed of a modular double-pentaprism system that enables the long trace profiler (LTP) to measure mirrors in nonconventional ways, i.e., in the vertical-downward and sideways positions, has been devised and implemented in the Advanced Photon Source (APS) long trace profiler (LTP II). The systems is very useful in calibrating mirror-bender assemblies. This paper describes the system and gives results of measurements performed with it on a mirror used at the APS.},
doi = {},
url = {https://www.osti.gov/biblio/750600},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Nov 22 00:00:00 EST 1999},
month = {Mon Nov 22 00:00:00 EST 1999}
}
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