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Title: A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler

Abstract

A simple device composed of a modular double-pentaprism system that enables the long trace profiler (LTP) to measure mirrors in nonconventional ways, i.e., in the vertical-downward and sideways positions, has been devised and implemented in the Advanced Photon Source (APS) long trace profiler (LTP II). The systems is very useful in calibrating mirror-bender assemblies. This paper describes the system and gives results of measurements performed with it on a mirror used at the APS.

Authors:
;
Publication Date:
Research Org.:
Argonne National Lab., IL (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
750600
Report Number(s):
ANL/UPD/CP-100563
TRN: US0003514
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Conference
Resource Relation:
Conference: American Institute of Physics, Stanford, CA (US), 10/13/1999--10/15/1999; Other Information: PBD: 22 Nov 1999
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; ADVANCED PHOTON SOURCE; ACCELERATOR FACILITIES; MEASURING INSTRUMENTS; MIRRORS; CALIBRATION; OPTICAL SYSTEMS; MEASURING METHODS

Citation Formats

Assoufid, L, and Her, P. A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler. United States: N. p., 1999. Web.
Assoufid, L, & Her, P. A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler. United States.
Assoufid, L, and Her, P. Mon . "A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler". United States. https://www.osti.gov/servlets/purl/750600.
@article{osti_750600,
title = {A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler},
author = {Assoufid, L and Her, P},
abstractNote = {A simple device composed of a modular double-pentaprism system that enables the long trace profiler (LTP) to measure mirrors in nonconventional ways, i.e., in the vertical-downward and sideways positions, has been devised and implemented in the Advanced Photon Source (APS) long trace profiler (LTP II). The systems is very useful in calibrating mirror-bender assemblies. This paper describes the system and gives results of measurements performed with it on a mirror used at the APS.},
doi = {},
url = {https://www.osti.gov/biblio/750600}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {11}
}

Conference:
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