Polarized spectral emittance from periodic micromachined surfaces: IV. Undoped silicon: Normal direction in deep lamellar gratings

Journal Article · Thu Feb 20 00:00:00 EST 1992 · Applied Optics; (United States)

DOI:https://doi.org/10.1364/AO.31.000732· OSTI ID:7304041

Wang, T K; Zemel, J N ^[1]

---

1. Hewlett-Packard, Route 41, Avondale, Pennsylvania 19311-0900 (United States)

Experimental results of thermal emittance from deep gratings are presented along with a theoretical discussion. We have found that for a certain grating geometry thermal emission peaks coincide with the cutoff frequencies of slab waveguides. The coincidence was found with {ital s}- but not {ital p}-polarized emission. This suggests that coupling between grating fins for {ital s}-polarized emission is small. It was also found that emission peaks do not correlate directly with the well-known grating equation for these deep gratings.

• DOE Contract Number: FG02-88ER13964
• OSTI ID: 7304041
• Journal Information: Applied Optics; (United States), Vol. 31:6; ISSN 0003-6935
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
GRATINGS
THERMAL RADIATION
FLUCTUATIONS
POLARIZATION
SILICON
WAVEGUIDES
ELECTROMAGNETIC RADIATION
ELEMENTS
RADIATIONS
SEMIMETALS
VARIATIONS
440600* - Optical Instrumentation- (1990-)