Reliability evaluation of radiation hardened quad nand gates. Final technical report
Technical Report
·
OSTI ID:7301881
- Research Organization:
- Rome Air Development Center, Griffiss AFB, NY (USA)
- OSTI ID:
- 7301881
- Report Number(s):
- AD-893617; RADC-TR-72-38
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
GATING CIRCUITS
PHYSICAL RADIATION EFFECTS
TESTING
INTEGRATED CIRCUITS
FAILURES
RADIATION HARDENING
RELIABILITY
THERMAL TESTING
ELECTRONIC CIRCUITS
HARDENING
MATERIALS TESTING
MICROELECTRONIC CIRCUITS
NONDESTRUCTIVE TESTING
RADIATION EFFECTS
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems
GATING CIRCUITS
PHYSICAL RADIATION EFFECTS
TESTING
INTEGRATED CIRCUITS
FAILURES
RADIATION HARDENING
RELIABILITY
THERMAL TESTING
ELECTRONIC CIRCUITS
HARDENING
MATERIALS TESTING
MICROELECTRONIC CIRCUITS
NONDESTRUCTIVE TESTING
RADIATION EFFECTS
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems